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Yu Harubeppu

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  • Hitachinaka-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Test Jig and Test Method
    • Publication number 20230324255
    • Publication date Oct 12, 2023
    • Hitachi, Ltd
    • Yu HARUBEPPU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEMICONDUCTOR DEVICE
    • Publication number 20230074352
    • Publication date Mar 9, 2023
    • Hitachi Power Semiconductor Device, Ltd.
    • Naoki TAKEDA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor Device
    • Publication number 20210143081
    • Publication date May 13, 2021
    • Hitachi Power Semiconductor Device, Ltd.
    • Naoki TAKEDA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Power Semiconductor Device
    • Publication number 20130135824
    • Publication date May 30, 2013
    • Hitachi, Ltd
    • Yu Harubeppu
    • H01 - BASIC ELECTRIC ELEMENTS