Yu Harubeppu

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Hitachinaka-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test jig and test method
- Patent number 12,146,816
- Issue date Nov 19, 2024
- Hitachi, Ltd.
- Yu Harubeppu
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including a semiconductor element with a gate...
- Patent number 11,652,023
- Issue date May 16, 2023
- Hitachi Power Semiconductor Device, Ltd.
- Naoki Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power semiconductor device
- Patent number 9,013,877
- Issue date Apr 21, 2015
- Hitachi Power Semiconductor Device, Ltd.
- Yu Harubeppu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Test Jig and Test Method
- Publication number 20230324255
- Publication date Oct 12, 2023
- Hitachi, Ltd
- Yu HARUBEPPU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230074352
- Publication date Mar 9, 2023
- Hitachi Power Semiconductor Device, Ltd.
- Naoki TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device
- Publication number 20210143081
- Publication date May 13, 2021
- Hitachi Power Semiconductor Device, Ltd.
- Naoki TAKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power Semiconductor Device
- Publication number 20130135824
- Publication date May 30, 2013
- Hitachi, Ltd
- Yu Harubeppu
- H01 - BASIC ELECTRIC ELEMENTS