Membership
Tour
Register
Log in
Yu-Ho Ni
Follow
Person
Hsin-Chu, TW
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for monitoring the relative relationship betwe...
Patent number
11,349,414
Issue date
May 31, 2022
Advanced Ion Beam Technology, Inc.
Te-Min Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer charges monitoring
Patent number
11,062,926
Issue date
Jul 13, 2021
Advanced Ion Beam Technology, Inc.
Chih-Chiang Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Calibration system with at least one camera and method thereof
Patent number
10,984,524
Issue date
Apr 20, 2021
Advanced Ion Beam Technology, Inc.
Chien-Li Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for monitoring the relative relationship betwe...
Patent number
10,804,821
Issue date
Oct 13, 2020
Advanced Ion Beam Technology, Inc.
Te-Min Wang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of cleaning electrostatic chuck
Patent number
10,699,876
Issue date
Jun 30, 2020
Advanced Ion Beam Technology, Inc.
Yu-Ho Ni
B08 - CLEANING
Information
Patent Grant
Wafer charges monitoring
Patent number
10,475,678
Issue date
Nov 12, 2019
Advanced Ion Beam Technology, Inc.
Chih-Chiang Wu
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR MONITORING THE RELATIVE RELATIONSHIP BETWE...
Publication number
20200412280
Publication date
Dec 31, 2020
ADVANCED ION BEAM TECHNOLOGY, INC.
Te-Min Wang
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
WAFER CHARGES MONITORING
Publication number
20200035526
Publication date
Jan 30, 2020
ADVANCED ION BEAM TECHNOLOGY, INC.
Chih-Chiang Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Vacuum jacketed tube
Publication number
20190301661
Publication date
Oct 3, 2019
Advanced Ion Beam Technology, Inc.
Yu-Lin Chang
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Application
CALIBRATION SYSTEM WITH AT LEAST ONE CAMERA AND METHOD THEREOF
Publication number
20190197675
Publication date
Jun 27, 2019
Advanced Ion Beam Technology, Inc.
Chien-Li Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
WAFER CHARGES MONITORING
Publication number
20180330973
Publication date
Nov 15, 2018
ADVANCED ION BEAM TECHNOLOGY, INC.
Chih-Chiang Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND METHOD FOR MONITORING THE RELATIVE RELATIONSHIP BETWE...
Publication number
20180131293
Publication date
May 10, 2018
ADVANCED ION BEAM TECHNOLOGY, INC.
Te-Min Wang
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF CLEANING ELECTROSTATIC CHUCK
Publication number
20170125211
Publication date
May 4, 2017
ADVANCED ION BEAM TECHNOLOGY, INC.
Yu-Ho Ni
B08 - CLEANING