Yu-hyun Oh

Follow

Person

Changwon-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Test method for a system on chip and a test system for the system o...
- Patent number 11,549,979
- Issue date Jan 10, 2023
- Samsung Electronics Co., Ltd.
- Hyun-Chul Baek
- G01 - MEASURING TESTING
Information Patent Grant
Storage device test system
- Patent number 9,372,225
- Issue date Jun 21, 2016
- Samsung Electronics Co., Ltd.
- Kwang-kyu Bang
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST METHOD FOR A SYSTEM ON CHIP AND A TEST SYSTEM FOR THE SYSTEM O...
- Publication number 20220196730
- Publication date Jun 23, 2022
- Samsung Electronics Co., Ltd.
- Hyun-Chul BAEK
- G01 - MEASURING TESTING
Information Patent Application
Storage Device Test System
- Publication number 20140021977
- Publication date Jan 23, 2014
- Kwang-kyu Bang
- G01 - MEASURING TESTING