Yu Ishibashi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen-driving apparatus for electron microscope which tilts and...
- Patent number 5,264,705
- Issue date Nov 23, 1993
- Jeol Ltd.
- Toshikazu Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam focusing system for electron microscope
- Patent number 4,626,689
- Issue date Dec 2, 1986
- Jeol Ltd.
- Takeshi Tomita
- H01 - BASIC ELECTRIC ELEMENTS