Yu Jimbo

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and specimen contamination prevention method
- Patent number 12,131,881
- Issue date Oct 29, 2024
- Jeol Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,676,796
- Issue date Jun 13, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liner tube and electron microscope
- Patent number 9,997,327
- Issue date Jun 12, 2018
- Jeol Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spherical aberration corrector, method of spherical aberration corr...
- Patent number 9,256,068
- Issue date Feb 9, 2016
- Jeol Ltd.
- Hidetaka Sawada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope, Multipole Element for Use Therein, and Control...
- Publication number 20240145210
- Publication date May 2, 2024
- JEOL Ltd.
- Shigeyuki Morishita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Specimen Contamination Prevention Method
- Publication number 20220328280
- Publication date Oct 13, 2022
- JEOL Ltd.
- Takeshi Kaneko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220084783
- Publication date Mar 17, 2022
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liner Tube and Electron Microscope
- Publication number 20180166252
- Publication date Jun 14, 2018
- JEOL Ltd.
- Hidetaka Sawada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Spherical Aberration Corrector, Method of Spherical Aberration Corr...
- Publication number 20150029593
- Publication date Jan 29, 2015
- JEOL Ltd.
- Hidetaka Sawada
- G02 - OPTICS