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Yu-Wen Huang
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Tigardf, OR, US
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last 30 patents
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Patent Grant
Probe systems including imaging devices with objective lens isolato...
Patent number
11,874,301
Issue date
Jan 16, 2024
FormFactor, Inc.
Kazuki Negishi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...
Publication number
20210132115
Publication date
May 6, 2021
FormFactor Beaverton, Inc.
Kazuki Negishi
G01 - MEASURING TESTING