Yu YAMAZAWA

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device, and observation method and elemental...
- Patent number 11,031,211
- Issue date Jun 8, 2021
- HITACHI HIGH-TECH CORPORATION
- Naoto Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission scanning microscopy including electron energy loss spe...
- Patent number 10,373,802
- Issue date Aug 6, 2019
- Hitachi High-Technologies Corporation
- Yu Yamazawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20220199356
- Publication date Jun 23, 2022
- HITACHI HIGH-TECH CORPORATION
- Tomonori NAKANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Beam Apparatus
- Publication number 20210233737
- Publication date Jul 29, 2021
- Hitachi High-Tech Corporation
- Yu YAMAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, and Observation Method and Elemental...
- Publication number 20200185190
- Publication date Jun 11, 2020
- Hitachi High-Technologies Corporation
- Naoto ITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSMISSION SCANNING MICROSCOPY INCLUDING ELECTRON ENERGY LOSS SPE...
- Publication number 20180308659
- Publication date Oct 25, 2018
- Hitachi High-Technologies Corporation
- Yu YAMAZAWA
- H01 - BASIC ELECTRIC ELEMENTS