Yu YANAKA

Person

Kamisato, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for inspecting surface of a disk
- Patent number 8,873,031
- Issue date Oct 28, 2014
- Hitachi High-Technologies Corporation
- Yu Yanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting patterned media disk
- Patent number 8,605,278
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Ryuta Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a surface of a substrate
- Patent number 8,547,545
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Hideaki Sasazawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20140071442
- Publication date Mar 13, 2014
- Hitachi High-Technologies Corporation
- Shigeru SERIKAWA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTING APPARATUS HAVING DOUBLE RECIPE PROCESSING FUNCTION
- Publication number 20140043603
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Yu YANAKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SURFACE OF A DISK
- Publication number 20130258326
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Kiyotaka HORIE
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE INSPECTION METHOD AND DISK SURFACE INSPECTION DEVICE
- Publication number 20130258328
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Nobuyuki SUGIMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SURFACE OF A MAGNETIC DISK
- Publication number 20130258320
- Publication date Oct 3, 2013
- Hitachi High-Technologies Corporation
- Toshiharu FUNAKI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE SURFACE DEFECT INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20130077092
- Publication date Mar 28, 2013
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND DEVICE FOR SAME
- Publication number 20120320367
- Publication date Dec 20, 2012
- Hitachi High-Technologies Corporation
- Yu Yanaka
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNED MEDIA DISK
- Publication number 20120154798
- Publication date Jun 21, 2012
- Hitachi High-Technologies Corporation
- Ryuta SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE
- Publication number 20120081701
- Publication date Apr 5, 2012
- Hitachi High-Technologies Corporation
- Hideaki SASAZAWA
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20100246356
- Publication date Sep 30, 2010
- Hitachi High-Technologies Corporation
- Bin Abdulrashid FARIZ
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus for inspecting surface of a disk

Method and apparatus for inspecting patterned media disk

Method and apparatus for inspecting a surface of a substrate

Patents Applicationslast 30 patents

OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...

SURFACE INSPECTING APPARATUS HAVING DOUBLE RECIPE PROCESSING FUNCTION

METHOD AND APPARATUS FOR INSPECTING SURFACE OF A DISK

DISK SURFACE INSPECTION METHOD AND DISK SURFACE INSPECTION DEVICE

METHOD AND APPARATUS FOR INSPECTING SURFACE OF A MAGNETIC DISK

SUBSTRATE SURFACE DEFECT INSPECTION METHOD AND INSPECTION DEVICE

INSPECTION METHOD AND DEVICE FOR SAME

METHOD AND APPARATUS FOR INSPECTING PATTERNED MEDIA DISK

METHOD AND APPARATUS FOR INSPECTING A SURFACE OF A SUBSTRATE

DISK SURFACE DEFECT INSPECTION METHOD AND APPARATUS