Yu Zhu

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Soraku-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing schottky junction method for evaluating semico...
- Patent number 6,239,608
- Issue date May 29, 2001
- Sharp Kabushiki Kaisha
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing Schottky junction, method for evaluating semic...
- Patent number 5,942,909
- Issue date Aug 24, 1999
- Sharp Kabushiki Kaisha
- Yu Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Heterojunction semiconductor device
- Patent number 5,912,480
- Issue date Jun 15, 1999
- Sharp Kabushiki Kaisha
- Yu Zhu
- H01 - BASIC ELECTRIC ELEMENTS