YUAN-CHIEH CHIU

Person

Zhubei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit packages having mechanical brace standoffs
- Patent number 12,080,623
- Issue date Sep 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yuan Sheng Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor package comprising heat dissipation plates
- Patent number 11,996,342
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen-Hsiang Lao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating memory device
- Patent number 11,991,882
- Issue date May 21, 2024
- Macronix International Co., Ltd.
- Yao-An Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device and method
- Patent number 11,735,651
- Issue date Aug 22, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Shu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device and method
- Patent number 11,437,498
- Issue date Sep 6, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Shu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device and method for fabricating the same
- Patent number 11,211,401
- Issue date Dec 28, 2021
- Macronix International Co., Ltd.
- Yao-An Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit package and method
- Patent number 11,011,451
- Issue date May 18, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yuan Sheng Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FinFET device and method
- Patent number 10,861,960
- Issue date Dec 8, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chung-Shu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned contact and manufacturing method thereof
- Patent number 10,825,907
- Issue date Nov 3, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tung Ying Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for removing particles from etching chamber
- Patent number 10,790,124
- Issue date Sep 29, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Chao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure for three-dimensional memory device and man...
- Patent number 10,770,476
- Issue date Sep 8, 2020
- Macronix International Co., Ltd.
- Yao-An Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor device
- Patent number 10,607,848
- Issue date Mar 31, 2020
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Three-dimensional non-volatile memory and manufacturing method thereof
- Patent number 10,424,593
- Issue date Sep 24, 2019
- Macronix International Co., Ltd.
- I-Ting Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned contact and manufacturing method thereof
- Patent number 10,164,032
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tung Ying Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a contact
- Patent number 10,032,887
- Issue date Jul 24, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Lien Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of fabricating the same
- Patent number 9,953,841
- Issue date Apr 24, 2018
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for removing particles from etching chamber
- Patent number 9,934,945
- Issue date Apr 3, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Chao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a contact
- Patent number 9,627,258
- Issue date Apr 18, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Lien Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory device and method of manufacturing the same
- Patent number 9,559,049
- Issue date Jan 31, 2017
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for removing particles from etching chamber
- Patent number 9,355,823
- Issue date May 31, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Chao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with well controlled surface proximity an...
- Patent number 9,349,831
- Issue date May 24, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with well controlled surface proximity an...
- Patent number 8,900,960
- Issue date Dec 2, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductance-capacitance (LC) oscillator
- Patent number 8,717,112
- Issue date May 6, 2014
- Industrial Technology Research Institute
- Hong-Yeh Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit device with well controlled surface proximity an...
- Patent number 8,614,132
- Issue date Dec 24, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Source and drain feature profile for improving device performance a...
- Patent number 8,236,659
- Issue date Aug 7, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spacer layer etch method providing enhanced microelectronic device...
- Patent number 7,678,655
- Issue date Mar 16, 2010
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Hung Der Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating dual-gate semiconductor device
- Patent number 7,510,940
- Issue date Mar 31, 2009
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Nan Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ plasma treatment of advanced resists in fine pattern defini...
- Patent number 7,390,753
- Issue date Jun 24, 2008
- Taiwan Semiconductor Mfg. Co., Ltd.
- Li-Te Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phosphoric acid free process for polysilicon gate definition
- Patent number 7,307,009
- Issue date Dec 11, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Li-Te S. Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
In-situ critical dimension measurement
- Patent number 7,301,645
- Issue date Nov 27, 2007
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shiang-Bau Wang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE
- Publication number 20250107081
- Publication date Mar 27, 2025
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20240387368
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chin-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PACKAGES HAVING MECHANICAL BRACE STANDOFFS
- Publication number 20240363486
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yuan Sheng Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20240282659
- Publication date Aug 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Hsiang Lao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Device and Method of Manufacture
- Publication number 20230361027
- Publication date Nov 9, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chin-Yi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PACKAGE
- Publication number 20230064253
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen-Hsiang Lao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET DEVICE AND METHOD
- Publication number 20220359735
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Shu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING MEMORY DEVICE
- Publication number 20220077187
- Publication date Mar 10, 2022
- Macronix International Co., Ltd.
- YAO-AN CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Package and Method
- Publication number 20210272875
- Publication date Sep 2, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yuan Sheng Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20210202518
- Publication date Jul 1, 2021
- Macronix International Co., Ltd.
- YAO-AN CHUNG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FINFET DEVICE AND METHOD
- Publication number 20210111272
- Publication date Apr 15, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chung-Shu Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE FOR THREE-DIMENSIONAL MEMORY DEVICE AND MAN...
- Publication number 20200312866
- Publication date Oct 1, 2020
- Macronix International Co., Ltd.
- Yao-An Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT PACKAGE AND METHOD
- Publication number 20200185304
- Publication date Jun 11, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yuan Sheng Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THREE-DIMENSIONAL NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF
- Publication number 20190214402
- Publication date Jul 11, 2019
- Macronix International Co., Ltd.
- I-Ting Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Self-Aligned Contact and Manufacturing Method Thereof
- Publication number 20180350927
- Publication date Dec 6, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tung Ying Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20180233375
- Publication date Aug 16, 2018
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Removing Particles from Etching Chamber
- Publication number 20180226235
- Publication date Aug 9, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Chao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Forming a Contact
- Publication number 20170365691
- Publication date Dec 21, 2017
- Taiwan Semiconductor Manufacturing Co., LTD
- Yu-Lien Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-ALIGNED CONTACT AND MANUFACTURING METHOD THEREOF
- Publication number 20170365674
- Publication date Dec 21, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tung Ying Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20170053867
- Publication date Feb 23, 2017
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
- Publication number 20160329243
- Publication date Nov 10, 2016
- Macronix International Co., Ltd.
- Yuan-Chieh Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Removing Particles from Etching Chamber
- Publication number 20160268106
- Publication date Sep 15, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Chao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR REMOVING PARTICLES FROM ETCHING CHAMBER
- Publication number 20150325417
- Publication date Nov 12, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu Chao Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE WITH WELL CONTROLLED SURFACE PROXIMITY AN...
- Publication number 20140106522
- Publication date Apr 17, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR HOLE STRUCTURE
- Publication number 20130341762
- Publication date Dec 26, 2013
- Macronix International Co., Ltd.
- YUAN-CHIEH CHIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Circuit Device with Well Controlled Surface Proximity an...
- Publication number 20130323891
- Publication date Dec 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDUCTANCE-CAPACITANCE (LC) OSCILLATOR
- Publication number 20130009715
- Publication date Jan 10, 2013
- Industrial Technology Research Institute
- Hong-Yeh Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTEGRATED CIRCUIT DEVICE WITH WELL CONTROLLED SURFACE PROXIMITY AN...
- Publication number 20120083088
- Publication date Apr 5, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Hsuan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SOURCE AND DRAIN FEATURE PROFILE FOR IMPROVING DEVICE PERFORMANCE A...
- Publication number 20110312145
- Publication date Dec 22, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Huan Tsai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multiple Deposition, Multiple Treatment Dielectric Layer For A Semi...
- Publication number 20110256682
- Publication date Oct 20, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Xiong-Fei Yu
- H01 - BASIC ELECTRIC ELEMENTS

YUAN-CHIEH CHIU

Person

Patents Grantslast 30 patents

Integrated circuit packages having mechanical brace standoffs

Semiconductor package comprising heat dissipation plates

Method for fabricating memory device

FinFET device and method

FinFET device and method

Memory device and method for fabricating the same

Integrated circuit package and method

FinFET device and method

Self-aligned contact and manufacturing method thereof

Methods for removing particles from etching chamber

Semiconductor structure for three-dimensional memory device and man...

Method of fabricating semiconductor device

Three-dimensional non-volatile memory and manufacturing method thereof

Self-aligned contact and manufacturing method thereof

Method of forming a contact

Semiconductor device and method of fabricating the same

Methods for removing particles from etching chamber

Method of forming a contact

Memory device and method of manufacturing the same

Methods for removing particles from etching chamber

Integrated circuit device with well controlled surface proximity an...

Integrated circuit device with well controlled surface proximity an...

Inductance-capacitance (LC) oscillator

Integrated circuit device with well controlled surface proximity an...

Source and drain feature profile for improving device performance a...

Spacer layer etch method providing enhanced microelectronic device...

Method for fabricating dual-gate semiconductor device

In-situ plasma treatment of advanced resists in fine pattern defini...

Phosphoric acid free process for polysilicon gate definition

In-situ critical dimension measurement

Patents Applicationslast 30 patents

MEMORY DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

INTEGRATED CIRCUIT PACKAGES HAVING MECHANICAL BRACE STANDOFFS

SEMICONDUCTOR PACKAGE

Semiconductor Device and Method of Manufacture

SEMICONDUCTOR PACKAGE

FINFET DEVICE AND METHOD

METHOD FOR FABRICATING MEMORY DEVICE

Integrated Circuit Package and Method

MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME

FINFET DEVICE AND METHOD

SEMICONDUCTOR STRUCTURE FOR THREE-DIMENSIONAL MEMORY DEVICE AND MAN...

INTEGRATED CIRCUIT PACKAGE AND METHOD

THREE-DIMENSIONAL NON-VOLATILE MEMORY AND MANUFACTURING METHOD THEREOF

Self-Aligned Contact and Manufacturing Method Thereof

METHOD OF FABRICATING SEMICONDUCTOR DEVICE

Methods for Removing Particles from Etching Chamber

Method of Forming a Contact

SELF-ALIGNED CONTACT AND MANUFACTURING METHOD THEREOF

MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME

Methods for Removing Particles from Etching Chamber

METHODS FOR REMOVING PARTICLES FROM ETCHING CHAMBER

INTEGRATED CIRCUIT DEVICE WITH WELL CONTROLLED SURFACE PROXIMITY AN...

SEMICONDUCTOR HOLE STRUCTURE

Integrated Circuit Device with Well Controlled Surface Proximity an...

INDUCTANCE-CAPACITANCE (LC) OSCILLATOR

INTEGRATED CIRCUIT DEVICE WITH WELL CONTROLLED SURFACE PROXIMITY AN...

SOURCE AND DRAIN FEATURE PROFILE FOR IMPROVING DEVICE PERFORMANCE A...

Multiple Deposition, Multiple Treatment Dielectric Layer For A Semi...