Yuan-Fu Ko

Person

Tainan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device including metal interconnections having sidewa...
- Patent number 12,057,346
- Issue date Aug 6, 2024
- United Microelectronics Corp.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of copper hillock detecting
- Patent number 12,007,435
- Issue date Jun 11, 2024
- United Microelectronics Corp.
- Ching-Chih Chang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including metal interconnections having sidewa...
- Patent number 11,791,203
- Issue date Oct 17, 2023
- United Microelectronics Corp.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming contact holes using litho-etch-litho-etch approach
- Patent number 11,515,159
- Issue date Nov 29, 2022
- United Microelectronics Corp.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device including metal interconnections having sidewa...
- Patent number 11,456,207
- Issue date Sep 27, 2022
- United Microelectronics Corp.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Forming contact holes using litho-etch-litho-etch approach
- Patent number 10,916,427
- Issue date Feb 9, 2021
- United Microelectronics Corp.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for removing damaged layer embedded in a dielectric layer
- Patent number 10,204,826
- Issue date Feb 12, 2019
- United Microelectronics Corp.
- Min-Shiang Hsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20240347382
- Publication date Oct 17, 2024
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230420292
- Publication date Dec 28, 2023
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL INTERCONNECT STRUCTURE HAVING SERPENT METAL LINE
- Publication number 20230050928
- Publication date Feb 16, 2023
- UNITED MICROELECTRONICS CORP.
- Shih-Che Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20220392798
- Publication date Dec 8, 2022
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF COPPER HILLOCK DETECTING
- Publication number 20220178992
- Publication date Jun 9, 2022
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- G01 - MEASURING TESTING
Information Patent Application
FORMING CONTACT HOLES USING LITHO-ETCH-LITHO-ETCH APPROACH
- Publication number 20210151321
- Publication date May 20, 2021
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20200402837
- Publication date Dec 24, 2020
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING SEMICONDUCTOR DEVICE
- Publication number 20200020576
- Publication date Jan 16, 2020
- UNITED MICROELECTRONICS CORP.
- Ching-Chih Chang
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Semiconductor device including metal interconnections having sidewa...

Method of copper hillock detecting

Semiconductor device including metal interconnections having sidewa...

Forming contact holes using litho-etch-litho-etch approach

Semiconductor device including metal interconnections having sidewa...

Forming contact holes using litho-etch-litho-etch approach

Method for removing damaged layer embedded in a dielectric layer

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METAL INTERCONNECT STRUCTURE HAVING SERPENT METAL LINE

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD OF COPPER HILLOCK DETECTING

FORMING CONTACT HOLES USING LITHO-ETCH-LITHO-ETCH APPROACH

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD FOR FORMING SEMICONDUCTOR DEVICE