Yuan-Han LEE

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Baoshan Township, TW

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Patents Grantslast 30 patents

Information Patent Grant
System for and method of semiconductor fault detection
- Patent number 9,390,219
- Issue date Jul 12, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar Goel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR AND METHOD OF SEMICONDUCTOR FAULT DETECTION
- Publication number 20150347664
- Publication date Dec 3, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sandeep Kumar GOEL
- G06 - COMPUTING CALCULATING COUNTING