Yuan-Ku Lan

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting defect in semiconductor fabrication process
- Patent number 11,988,970
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yuan-Ku Lan
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING DEFECT IN SEMICONDUCTOR FABRICATION PROCESS
- Publication number 20210356870
- Publication date Nov 18, 2021
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yuan-Ku Lan
- G01 - MEASURING TESTING