Yuan WU

Person

Shanghai, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Technologies for framework-level audio device virtualization
- Patent number 12,106,009
- Issue date Oct 1, 2024
- Intel Corporation
- Shoumeng Yan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe card with angled probe and wafer testing method using the same
- Patent number 11,994,555
- Issue date May 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card with angled probe and wafer testing method using the same
- Patent number 11,105,848
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Technologies for framework-level audio device virtualization
- Patent number 10,776,072
- Issue date Sep 15, 2020
- Intel Corporation
- Shoumeng Yan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Probe card and wafer testing system and wafer testing method
- Patent number 10,670,654
- Issue date Jun 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yuan-Chun Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for diminishing signal interference of transmi...
- Patent number 10,145,727
- Issue date Dec 4, 2018
- Fudan University
- Bo Jia
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for reducing interference from scattered light/reflected lig...
- Patent number 9,658,052
- Issue date May 23, 2017
- Fudan University
- Bo Jia
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION OUTPUT METHODS AND APPARATUSES, COMPUTER EQUIPMENT AND...
- Publication number 20240095654
- Publication date Mar 21, 2024
- ZHEJIANG KOUBEI NETWORK TECHNOLOGY CO., LTD.
- Yun JI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD WITH ANGLED PROBE AND WAFER TESTING METHOD USING THE SAME
- Publication number 20210389370
- Publication date Dec 16, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yuan-Chun WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNOLOGIES FOR FRAMEWORK-LEVEL AUDIO DEVICE VIRTUALIZATION
- Publication number 20210064333
- Publication date Mar 4, 2021
- Intel Corporation
- Shoumeng Yan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD AND WAFER TESTING METHOD
- Publication number 20200292615
- Publication date Sep 17, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yuan-Chun WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TECHNOLOGIES FOR FRAMEWORK-LEVEL AUDIO DEVICE VIRTUALIZATION
- Publication number 20170286048
- Publication date Oct 5, 2017
- Shoumeng Yan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD AND WAFER TESTING SYSTEM AND WAFER TESTING METHOD
- Publication number 20170184663
- Publication date Jun 29, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yuan-Chun WU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND STRUCTURE FOR DIMINISHING SIGNAL INTERFERENCE OF TRANSMI...
- Publication number 20160252341
- Publication date Sep 1, 2016
- Fudan University
- Bo JIA
- G02 - OPTICS
Information Patent Application
METHOD FOR REDUCING INTERFERENCE FROM SCATTERED LIGHT/REFLECTED LIG...
- Publication number 20150377603
- Publication date Dec 31, 2015
- Fudan University
- Bo JIA
- G02 - OPTICS

Person

Patents Grantslast 30 patents

Technologies for framework-level audio device virtualization

Probe card with angled probe and wafer testing method using the same

Probe card with angled probe and wafer testing method using the same

Technologies for framework-level audio device virtualization

Probe card and wafer testing system and wafer testing method

Method and structure for diminishing signal interference of transmi...

Method for reducing interference from scattered light/reflected lig...

Patents Applicationslast 30 patents

INFORMATION OUTPUT METHODS AND APPARATUSES, COMPUTER EQUIPMENT AND...

PROBE CARD WITH ANGLED PROBE AND WAFER TESTING METHOD USING THE SAME

TECHNOLOGIES FOR FRAMEWORK-LEVEL AUDIO DEVICE VIRTUALIZATION

PROBE CARD AND WAFER TESTING METHOD

TECHNOLOGIES FOR FRAMEWORK-LEVEL AUDIO DEVICE VIRTUALIZATION

PROBE CARD AND WAFER TESTING SYSTEM AND WAFER TESTING METHOD

METHOD AND STRUCTURE FOR DIMINISHING SIGNAL INTERFERENCE OF TRANSMI...

METHOD FOR REDUCING INTERFERENCE FROM SCATTERED LIGHT/REFLECTED LIG...