Yuan-Yu Jau

Person

Albuquerque, NM, US

People

Patents Grantslast 30 patents

Information Patent Grant
Super resolution and fast surface B-field imaging using an NV-diamond
- Patent number 12,276,610
- Issue date Apr 15, 2025
- National Technology & Engineering Solutions of Sandia, LLC
- Yuan-Yu Jau
- G01 - MEASURING TESTING
Information Patent Grant
Detection and imaging of electric fields, using polarized neutrons
- Patent number 12,055,500
- Issue date Aug 6, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Yuan-Yu Jau
- G01 - MEASURING TESTING
Information Patent Grant
Guided cold atom inertial sensors with membrane integrated photonic...
- Patent number 11,971,256
- Issue date Apr 30, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Jongmin Lee
- G01 - MEASURING TESTING
Information Patent Grant
Suspended waveguides on membrane and needle structures towards phot...
- Patent number 11,914,188
- Issue date Feb 27, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Jongmin Lee
- G02 - OPTICS
Information Patent Grant
Low-frequency atomic electrometry
- Patent number 11,585,841
- Issue date Feb 21, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Yuan-Yu Jau
- G01 - MEASURING TESTING
Information Patent Grant
Optically pumped gradient magnetometer
- Patent number 11,543,474
- Issue date Jan 3, 2023
- National Technology & Engineering Solutions of Sandia, LLC
- Peter Schwindt
- G04 - HOROLOGY
Information Patent Grant
Atomic magnetometer with multiple spatial channels
- Patent number 9,995,800
- Issue date Jun 12, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Peter Schwindt
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for quantum information processing using entan...
- Patent number 9,934,469
- Issue date Apr 3, 2018
- National Technology & Engineering Solutions of Sandia, LLC
- Yuan Yu Jau
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Light-pulse atom interferometric device
- Patent number 9,291,508
- Issue date Mar 22, 2016
- Sandia Corporation
- Grant Biedermann
- G01 - MEASURING TESTING

Yuan-Yu Jau

Person

Patents Grantslast 30 patents

Super resolution and fast surface B-field imaging using an NV-diamond

Detection and imaging of electric fields, using polarized neutrons

Guided cold atom inertial sensors with membrane integrated photonic...

Suspended waveguides on membrane and needle structures towards phot...

Low-frequency atomic electrometry

Optically pumped gradient magnetometer

Atomic magnetometer with multiple spatial channels

Method and apparatus for quantum information processing using entan...

Light-pulse atom interferometric device