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Yuan-Yu Jau
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Albuquerque, NM, US
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last 30 patents
Information
Patent Grant
Detection and imaging of electric fields, using polarized neutrons
Patent number
12,055,500
Issue date
Aug 6, 2024
National Technology & Engineering Solutions of Sandia, LLC
Yuan-Yu Jau
G01 - MEASURING TESTING
Information
Patent Grant
Guided cold atom inertial sensors with membrane integrated photonic...
Patent number
11,971,256
Issue date
Apr 30, 2024
National Technology & Engineering Solutions of Sandia, LLC
Jongmin Lee
G01 - MEASURING TESTING
Information
Patent Grant
Suspended waveguides on membrane and needle structures towards phot...
Patent number
11,914,188
Issue date
Feb 27, 2024
National Technology & Engineering Solutions of Sandia, LLC
Jongmin Lee
G02 - OPTICS
Information
Patent Grant
Low-frequency atomic electrometry
Patent number
11,585,841
Issue date
Feb 21, 2023
National Technology & Engineering Solutions of Sandia, LLC
Yuan-Yu Jau
G01 - MEASURING TESTING
Information
Patent Grant
Optically pumped gradient magnetometer
Patent number
11,543,474
Issue date
Jan 3, 2023
National Technology & Engineering Solutions of Sandia, LLC
Peter Schwindt
G04 - HOROLOGY
Information
Patent Grant
Atomic magnetometer with multiple spatial channels
Patent number
9,995,800
Issue date
Jun 12, 2018
National Technology & Engineering Solutions of Sandia, LLC
Peter Schwindt
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method and apparatus for quantum information processing using entan...
Patent number
9,934,469
Issue date
Apr 3, 2018
National Technology & Engineering Solutions of Sandia, LLC
Yuan Yu Jau
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Light-pulse atom interferometric device
Patent number
9,291,508
Issue date
Mar 22, 2016
Sandia Corporation
Grant Biedermann
G01 - MEASURING TESTING