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Yuan Yu
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San Jose, CA, US
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Patents Grants
last 30 patents
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Patent Grant
Test structures for measuring silicon thickness in fully depleted s...
Patent number
10,852,337
Issue date
Dec 1, 2020
PDF Solutions, Inc.
Sharad Saxena
G01 - MEASURING TESTING
Information
Patent Grant
Passive array test structure for cross-point memory characterization
Patent number
10,643,735
Issue date
May 5, 2020
PDF Solutions, Inc.
Tomasz Brozek
G11 - INFORMATION STORAGE
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Patent Grant
Test structures and method for electrical measurement of FinFET fin...
Patent number
10,529,631
Issue date
Jan 7, 2020
PDF Solutions, Inc.
Sharad Saxena
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for accurate measurement of leaky capacitors using charge ba...
Patent number
9,952,268
Issue date
Apr 24, 2018
PDF Solutions, Inc.
Sharad Saxena
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test structures and methods for measuring silicon thickness in full...
Patent number
9,691,669
Issue date
Jun 27, 2017
PDF Solutions, Inc.
Sharad Saxena
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED S...
Publication number
20170309524
Publication date
Oct 26, 2017
PDF Solutions, Inc.
Sharad Saxena
G01 - MEASURING TESTING