YUANJUN SHI

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JIANGSU, CN

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Patents Grantslast 30 patents

Information Patent Grant
Coaxial socket of impedance matching structure for semiconductor ch...
- Patent number 11,199,571
- Issue date Dec 14, 2021
- Yuanjun Shi
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe card
- Patent number 10,884,026
- Issue date Jan 5, 2021
- TWINSOLUTION TECHNOLOGY (SUZHOU) LTD
- Yuanjun Shi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST SOCKET OF HYBRID COAXIAL STRUCTURE AND MANUFACTU...
- Publication number 20210088578
- Publication date Mar 25, 2021
- Suzhou Taosheng Electronic Technology Co., Ltd.
- Yuanjun SHI
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL SOCKET OF IMPEDANCE MATCHING STRUCTURE FOR SEMICONDUCTOR CH...
- Publication number 20210088574
- Publication date Mar 25, 2021
- Suzhou Taosheng Electronic Technology Co., Ltd.
- Yuanjun SHI
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE CARD
- Publication number 20190250190
- Publication date Aug 15, 2019
- TWINSOLUTION TECHNOLOGY (SUZHOU) LTD
- YUANJUN SHI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR