Yuanyuan Wu

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
NAND early erase termination based on leakage current test
- Patent number 12,347,497
- Issue date Jul 1, 2025
- SanDisk Technologies, Inc.
- Yuanyuan Wu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
DEVICE LEAKAGE CURRENT MODEL AND METHOD FOR EXTRACTING THE SAME
- Publication number 20240232468
- Publication date Jul 11, 2024
- Shanghai Huali Integrated Circuit Corporation
- Qingwen WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EARLY ERASE TERMINATION AS A COUNTER-MEASURE FOR ERASE DISTURB
- Publication number 20240079066
- Publication date Mar 7, 2024
- Western Digital Technologies, Inc.
- Yuanyuan Wu
- G11 - INFORMATION STORAGE