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Yuanzhen ZHUANG
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Probe tip assembly for testing optical components
Patent number
11,885,830
Issue date
Jan 30, 2024
Lumentum Operations LLC
Sean Burns
G01 - MEASURING TESTING
Information
Patent Grant
Wafer prober to facilitate testing of a wafer using nanosecond pulses
Patent number
11,181,572
Issue date
Nov 23, 2021
Lumentum Operations LLC
Yuanzhen Zhuang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DRIVER CIRCUIT FOR EVALUATION OF AN OPTICAL EMITTER
Publication number
20230051475
Publication date
Feb 16, 2023
Lumentum Operations LLC
Mikhail DOLGANOV
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROBE TIP ASSEMBLY
Publication number
20220229091
Publication date
Jul 21, 2022
Lumentum Operations LLC
Sean BURNS
G01 - MEASURING TESTING
Information
Patent Application
WAFER PROBER TO FACILITATE TESTING OF A WAFER USING NANOSECOND PULSES
Publication number
20210325451
Publication date
Oct 21, 2021
Lumentum Operations LLC
Yuanzhen ZHUANG
G01 - MEASURING TESTING