Yuchen Deng

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Bifocal electron microscope
- Patent number 12,216,068
- Issue date Feb 4, 2025
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron diffraction holography
- Patent number 11,906,450
- Issue date Feb 20, 2024
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Auto-tuning stage settling time with feedback in charged particle m...
- Patent number 11,887,809
- Issue date Jan 30, 2024
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for quantum computing based sample analysis
- Patent number 11,799,486
- Issue date Oct 24, 2023
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for reducing the charging effect in a transmissio...
- Patent number 11,715,618
- Issue date Aug 1, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for quantum computing based sample analysis
- Patent number 11,501,197
- Issue date Nov 15, 2022
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron diffraction holography
- Patent number 11,460,419
- Issue date Oct 4, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for acquiring 3D diffraction data
- Patent number 11,456,149
- Issue date Sep 27, 2022
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simultaneous TEM and STEM microscope
- Patent number 11,404,241
- Issue date Aug 2, 2022
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam microscope system for imaging during sample processing
- Patent number 11,183,364
- Issue date Nov 23, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of imaging a sample using an electron microscope
- Patent number 10,937,625
- Issue date Mar 2, 2021
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for energy resolved chroma imaging
- Patent number 10,923,308
- Issue date Feb 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
BIFOCAL ELECTRON MICROSCOPE
- Publication number 20240272100
- Publication date Aug 15, 2024
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...
- Publication number 20240128050
- Publication date Apr 18, 2024
- FEI Company
- Yuchen DENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automated Selection And Model Training For Charged Particle Microsc...
- Publication number 20240071051
- Publication date Feb 29, 2024
- FEI Company
- John Francis Flanagan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC PARTICLE BEAM FOCUSING
- Publication number 20230245291
- Publication date Aug 3, 2023
- FEI Company
- Yuchen Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTO-TUNING STAGE SETTLING TIME WITH FEEDBACK IN CHARGED PARTICLE M...
- Publication number 20230238207
- Publication date Jul 27, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS
- Publication number 20230170910
- Publication date Jun 1, 2023
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...
- Publication number 20230040558
- Publication date Feb 9, 2023
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20230003672
- Publication date Jan 5, 2023
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AREA SELECTION IN CHARGED PARTICLE MICROSCOPE IMAGING
- Publication number 20220414855
- Publication date Dec 29, 2022
- FEI Company
- Yuchen DENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING
- Publication number 20210391145
- Publication date Dec 16, 2021
- FEI Company
- Yuchen Deng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DIFFRACTION HOLOGRAPHY
- Publication number 20210302333
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA
- Publication number 20210305010
- Publication date Sep 30, 2021
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE
- Publication number 20210305007
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIMULTANEOUS TEM AND STEM MICROSCOPE
- Publication number 20210305012
- Publication date Sep 30, 2021
- FEI Company
- Alexander Henstra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS
- Publication number 20210049493
- Publication date Feb 18, 2021
- FEI Company
- Valentina Caprara Vivoli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE
- Publication number 20200168433
- Publication date May 28, 2020
- FEI Company
- Erik Michiel Franken
- H01 - BASIC ELECTRIC ELEMENTS

Yuchen Deng

Person

Patents Grantslast 30 patents

Bifocal electron microscope

Electron diffraction holography

Auto-tuning stage settling time with feedback in charged particle m...

Systems and methods for quantum computing based sample analysis

System and method for reducing the charging effect in a transmissio...

Systems and methods for quantum computing based sample analysis

Electron diffraction holography

Methods and systems for acquiring 3D diffraction data

Simultaneous TEM and STEM microscope

Dual beam microscope system for imaging during sample processing

Method of imaging a sample using an electron microscope

Method and system for energy resolved chroma imaging

Patents Applicationslast 30 patents

BIFOCAL ELECTRON MICROSCOPE

METHOD OF AUTOMATED DATA ACQUISITION FOR A TRANSMISSION ELECTRON MI...

Automated Selection And Model Training For Charged Particle Microsc...

AUTOMATIC PARTICLE BEAM FOCUSING

AUTO-TUNING STAGE SETTLING TIME WITH FEEDBACK IN CHARGED PARTICLE M...

SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS

SYSTEM AND METHOD FOR REDUCING THE CHARGING EFFECT IN A TRANSMISSIO...

ELECTRON DIFFRACTION HOLOGRAPHY

AREA SELECTION IN CHARGED PARTICLE MICROSCOPE IMAGING

DUAL BEAM MICROSCOPE SYSTEM FOR IMAGING DURING SAMPLE PROCESSING

ELECTRON DIFFRACTION HOLOGRAPHY

METHODS AND SYSTEMS FOR ACQUIRING 3D DIFFRACTION DATA

DUAL BEAM BIFOCAL CHARGED PARTICLE MICROSCOPE

SIMULTANEOUS TEM AND STEM MICROSCOPE

SYSTEMS AND METHODS FOR QUANTUM COMPUTING BASED SAMPLE ANALYSIS

METHOD OF IMAGING A SAMPLE USING AN ELECTRON MICROSCOPE