TREA

Yudai KUBO

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  • Tokyo, JP
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Patents Applicationslast 30 patents

  • Information Patent Application

    Electron Microscope
    • Publication number 20240242923
    • Publication date Jul 18, 2024
    • Hitachi High-Tech Corporation
    • Michiko SUZUKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    ABERRATION CORRECTOR AND ELECTRON MICROSCOPE
    • Publication number 20240006148
    • Publication date Jan 4, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Hirokazu TAMAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor Analysis System
    • Publication number 20230063192
    • Publication date Mar 2, 2023
    • Hitachi High-Tech Corporation
    • Yudai KUBO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Semiconductor Analysis System
    • Publication number 20230055155
    • Publication date Feb 23, 2023
    • Hitachi High-Tech Corporation
    • Tsunenori NOMAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS