TREA

Yudan DENG

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  • Shanghai, CN
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Patents Grantslast 30 patents

  • Information Patent Grant

    Chip and chip test method
    • Patent number 12,019,117
    • Issue date Jun 25, 2024
    • Shanghai Biren Technology Co., Ltd
    • Kai Lei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Chip and chip testing method
    • Patent number 11,835,595
    • Issue date Dec 5, 2023
    • Shanghai Biren Technology Co., Ltd
    • Kai Lei
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    CHIP AND CHIP TESTING METHOD
    • Publication number 20230176141
    • Publication date Jun 8, 2023
    • Shanghai Biren Technology Co.,Ltd
    • Kai LEI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CHIP AND CHIP TEST METHOD
    • Publication number 20230176118
    • Publication date Jun 8, 2023
    • Shanghai Biren Technology Co.,Ltd
    • Kai LEI
    • G01 - MEASURING TESTING