Membership
Tour
Register
Log in
Yudong Hao
Follow
Person
Fremont, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Modeling conductive patterns using an effective model
Patent number
8,126,694
Issue date
Feb 28, 2012
Nanometrics Incorporated
Zhuan Liu
G01 - MEASURING TESTING
Information
Patent Grant
Correction of optical metrology for focus offset
Patent number
7,450,225
Issue date
Nov 11, 2008
Nanometrics Incorporated
Zhuan Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HOLISTIC ANALYSIS OF MULTIDIMENSIONAL SENSOR DATA FOR SUBSTRATE PRO...
Publication number
20230367302
Publication date
Nov 16, 2023
Applied Materials, Inc.
Chao Liu
G05 - CONTROLLING REGULATING
Information
Patent Application
TEMPERATURE-BASED METROLOGY CALIBRATION AT A MANUFACTURING SYSTEM
Publication number
20230317481
Publication date
Oct 5, 2023
Applied Materials, Inc.
Shifang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Modeling Conductive Patterns Using An Effective Model
Publication number
20090276198
Publication date
Nov 5, 2009
Nanometrics Incorporated
Zhuan Liu
G01 - MEASURING TESTING