Yudong Lu

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Guangdong, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method and device of remaining life prediction for electromigration...
- Patent number 10,732,216
- Issue date Aug 4, 2020
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
System and method for health monitoring and early warning for elect...
- Patent number 10,458,823
- Issue date Oct 29, 2019
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method and device of remaining life prediction for electromigration...
- Patent number 9,952,275
- Issue date Apr 24, 2018
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Prognostic circuit of electromigration failure for integrated circuit
- Patent number 9,329,228
- Issue date May 3, 2016
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR HEALTH MONITORING AND EARLY WARNING FOR ELECT...
- Publication number 20190154475
- Publication date May 23, 2019
- FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
Method and Device of Remaining Life Prediction for Electromigration...
- Publication number 20180188316
- Publication date Jul 5, 2018
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
Method and Device of Remaining Life Prediction for Electromigration...
- Publication number 20150051851
- Publication date Feb 19, 2015
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING
Information Patent Application
Prognostic Circuit of Electromigration Failure for Integrated Circuit
- Publication number 20140232428
- Publication date Aug 21, 2014
- Fifth Electronics Research Institute of Ministry of Industry and Information...
- Yiqiang Chen
- G01 - MEASURING TESTING