Yueh-Yi Lai

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Hsinchu, TW

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Patents Grantslast 30 patents

Information Patent Grant
Profile measurement system and profile measurement method
- Patent number 11,162,784
- Issue date Nov 2, 2021
- Industrial Technology Research Institute
- Ludovic Angot
- G01 - MEASURING TESTING
Information Patent Grant
Surface topography optical measuring system and surface topography...
- Patent number 10,571,252
- Issue date Feb 25, 2020
- Industrial Technology Research Institute
- Ludovic Angot
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for measuring multi-dimensions
- Patent number 10,008,005
- Issue date Jun 26, 2018
- Industrial Technology Research Institute
- Yueh-Yi Lai
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Imaging metamaterial for projecting an object image with molecular...
- Patent number 9,482,784
- Issue date Nov 1, 2016
- National Tsing Hua University
- Ta-Jen Yen
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR REMOTE SHARING THREE DIMENSIONAL SPACE ANNOTA...
- Publication number 20230342945
- Publication date Oct 26, 2023
- Industrial Technology Research Institute
- Yueh-Yi Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROFILE MEASUREMENT SYSTEM AND PROFILE MEASUREMENT METHOD
- Publication number 20210199425
- Publication date Jul 1, 2021
- Industrial Technology Research Institute
- Ludovic Angot
- G02 - OPTICS
Information Patent Application
SURFACE TOPOGRAPHY OPTICAL MEASURING SYSTEM AND SURFACE TOPOGRAPHY...
- Publication number 20200025555
- Publication date Jan 23, 2020
- Industrial Technology Research Institute
- Ludovic Angot
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD FOR MEASURING MULTI-DIMENSIONS
- Publication number 20180075618
- Publication date Mar 15, 2018
- Industrial Technology Research Institute
- Yueh-Yi LAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WORKPIECE MEASURING APPARATUS AND METHOD FOR MEASURING A WORKPIECE
- Publication number 20170169556
- Publication date Jun 15, 2017
- Industrial Technology Research Institute
- Yueh-Yi Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING METAMATERIAL
- Publication number 20140131559
- Publication date May 15, 2014
- National Tsing Hua University
- Ta-Jen Yen
- G02 - OPTICS