Yuetsu Watanabe

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card, and testing apparatus having the same
- Patent number 6,885,204
- Issue date Apr 26, 2005
- Mitsubishi Denki Kabushiki Kaisha
- Megumi Takemoto
- G01 - MEASURING TESTING
Information Patent Grant
Probe card, and testing apparatus having the same
- Patent number 6,667,626
- Issue date Dec 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Megumi Takemoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe card, and testing apparatus having the same
- Publication number 20040046580
- Publication date Mar 11, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Megumi Takemoto
- G01 - MEASURING TESTING
Information Patent Application
Probe card, and testing apparatus having the same
- Publication number 20030160624
- Publication date Aug 28, 2003
- Megumi Takemoto
- G01 - MEASURING TESTING