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Yuezhen Fan
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Test structure and method for calibrating three-dimensional thermog...
Patent number
9,417,309
Issue date
Aug 16, 2016
Xilinx, Inc.
Yuezhen Fan
G01 - MEASURING TESTING
Information
Patent Grant
Increased usable programmable device dice
Patent number
9,372,956
Issue date
Jun 21, 2016
Xilinx, Inc.
Yuezhen Fan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for compensating an integrated circuit layout...
Patent number
7,673,270
Issue date
Mar 2, 2010
Xilinx, Inc.
Yan Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for testing a memory device with a redundant s...
Patent number
7,626,874
Issue date
Dec 1, 2009
Xilinx, Inc.
Yuezhen Fan
G11 - INFORMATION STORAGE
Information
Patent Grant
Circuit for and method of determining the location of a defect in a...
Patent number
7,363,560
Issue date
Apr 22, 2008
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit for and method of identifying a defect in an integrate...
Patent number
7,227,364
Issue date
Jun 5, 2007
Xilinx, Inc.
Yuezhen Fan
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuits for localizing defective interconnect resources...
Patent number
7,145,344
Issue date
Dec 5, 2006
Xilinx, Inc.
David Mark
G01 - MEASURING TESTING
Information
Patent Grant
Correlation of electrical test data with physical defect data
Patent number
6,950,771
Issue date
Sep 27, 2005
Xilinx, Inc.
Yuezhen Fan
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
Method and circuits for localizing defective interconnect resources...
Publication number
20040103354
Publication date
May 27, 2004
Xilinx, Inc.
David Mark
H03 - BASIC ELECTRONIC CIRCUITRY