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last 30 patents
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Patent Grant
Measuring method for SPR and system thereof
Patent number
8,416,416
Issue date
Apr 9, 2013
National Center for Nanoscience and Technology
Zheng Zheng
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL PHASE DEVICE, METHOD AND SYSTEM
Publication number
20150204723
Publication date
Jul 23, 2015
BEIHANG UNIVERSITY
ZHENG ZHENG
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PHASE DEVICE, METHOD AND SYSTEM
Publication number
20130120750
Publication date
May 16, 2013
BEIHANG UNIVERSITY
Zheng Zheng
G02 - OPTICS
Information
Patent Application
OPTICAL PHASE DEVICE, METHOD AND SYSTEM.
Publication number
20130114079
Publication date
May 9, 2013
BEIHANG UNIVERSITY
Zheng Zheng
G02 - OPTICS
Information
Patent Application
MEASURING METHOD FOR SPR AND SYSTEM THEREOF
Publication number
20100321697
Publication date
Dec 23, 2010
Zheng Zheng
G01 - MEASURING TESTING