Yuhei Sakaguchi

Person

Osaka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Absorbance analysis apparatus for DCR gas, absorbance analysis meth...
- Patent number 11,796,460
- Issue date Oct 24, 2023
- Tokyo Electron Limited
- Yuichi Furuya
- G01 - MEASURING TESTING
Information Patent Grant
Light absorbance analysis apparatus and program record medium for r...
- Patent number 11,493,443
- Issue date Nov 8, 2022
- Horiba Stec, Co., Ltd.
- Toru Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Absorption spectroscopic system, program recording medium for an ab...
- Patent number 11,226,235
- Issue date Jan 18, 2022
- Horiba Stec, Co., Ltd.
- Toru Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Gas control system and film formation apparatus provided with gas c...
- Patent number 10,927,462
- Issue date Feb 23, 2021
- Horiba Stec, Co., Ltd.
- Hiroshi Nishizato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas control system, deposition apparatus including gas control syst...
- Patent number 10,655,220
- Issue date May 19, 2020
- HORIBA STEC, Co., Ltd.
- Yuhei Sakaguchi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Cp2Mg concentration measuring device
- Patent number 9,823,181
- Issue date Nov 21, 2017
- Horiba Stec, Co., Ltd.
- Daisuke Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Material gas concentration control system
- Patent number 8,459,290
- Issue date Jun 11, 2013
- HORIBA, Ltd.
- Masakazu Minami
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
GAS ANALYSIS DEVICE, FLUID CONTROL SYSTEM, GAS ANALYSIS PROGRAM, AN...
- Publication number 20240094176
- Publication date Mar 21, 2024
- Horiba Stec, Co., Ltd.
- Motonobu TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM
- Publication number 20240030013
- Publication date Jan 25, 2024
- Horiba Stec, Co., Ltd.
- Miyako HADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD
- Publication number 20230417660
- Publication date Dec 28, 2023
- Horiba Stec, Co., Ltd.
- Yuhei SAKAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYSIS APPARATUS AND GAS ANALYSIS METHOD
- Publication number 20230228677
- Publication date Jul 20, 2023
- Horiba Stec, Co., Ltd.
- Motonobu TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT CELL, OPTICAL ANALYZER, WINDOW FORMING MEMBER,...
- Publication number 20230228679
- Publication date Jul 20, 2023
- Horiba Stec, Co., Ltd.
- Yoshiaki NAKATA
- G01 - MEASURING TESTING
Information Patent Application
Absorbance analysis apparatus for DCR gas, absorbance analysis meth...
- Publication number 20220307977
- Publication date Sep 29, 2022
- TOKYO ELECTRON LIMITED
- Yuichi FURUYA
- G01 - MEASURING TESTING
Information Patent Application
ABSORPTION SPECTROSCOPIC SYSTEM, PROGRAM RECORDING MEDIUM FOR AN AB...
- Publication number 20200355551
- Publication date Nov 12, 2020
- Horiba Stec, Co., Ltd.
- Toru SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
LIGHT ABSORBANCE ANALYSIS APPARATUS AND PROGRAM RECORD MEDIUM FOR R...
- Publication number 20200340918
- Publication date Oct 29, 2020
- Horiba Stec, Co., Ltd.
- Toru SHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
ABSORBANCE METER AND SEMICONDUCTOR MANUFACTURING DEVICE USING ABSOR...
- Publication number 20190242818
- Publication date Aug 8, 2019
- Horiba Stec, Co., Ltd.
- Hiroshi NISHIZATO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
GAS CONTROL SYSTEM AND FILM FORMATION APPARATUS PROVIDED WITH GAS C...
- Publication number 20190161863
- Publication date May 30, 2019
- Horiba Stec, Co., Ltd.
- Hiroshi NISHIZATO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
GAS CONTROL SYSTEM, DEPOSITION APPARATUS INCLUDING GAS CONTROL SYST...
- Publication number 20180258530
- Publication date Sep 13, 2018
- HORIBA STEC, CO., LTD.
- Yuhei Sakaguchi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
CP2Mg CONCENTRATION MEASURING DEVICE
- Publication number 20170052115
- Publication date Feb 23, 2017
- Horiba Stec, Co., Ltd.
- Daisuke HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL GAS CONCENTRATION CONTROL SYSTEM
- Publication number 20100108154
- Publication date May 6, 2010
- HORIBA, Ltd.
- Masakazu Minami
- G05 - CONTROLLING REGULATING

Yuhei Sakaguchi

Person

Patents Grantslast 30 patents

Absorbance analysis apparatus for DCR gas, absorbance analysis meth...

Light absorbance analysis apparatus and program record medium for r...

Absorption spectroscopic system, program recording medium for an ab...

Gas control system and film formation apparatus provided with gas c...

Gas control system, deposition apparatus including gas control syst...

Cp2Mg concentration measuring device

Material gas concentration control system

Patents Applicationslast 30 patents

GAS ANALYSIS DEVICE, FLUID CONTROL SYSTEM, GAS ANALYSIS PROGRAM, AN...

ANALYSIS DEVICE, ANALYSIS METHOD, AND ANALYSIS PROGRAM

GAS ANALYSIS DEVICE AND GAS ANALYSIS METHOD

GAS ANALYSIS APPARATUS AND GAS ANALYSIS METHOD

OPTICAL MEASUREMENT CELL, OPTICAL ANALYZER, WINDOW FORMING MEMBER,...

Absorbance analysis apparatus for DCR gas, absorbance analysis meth...

ABSORPTION SPECTROSCOPIC SYSTEM, PROGRAM RECORDING MEDIUM FOR AN AB...

LIGHT ABSORBANCE ANALYSIS APPARATUS AND PROGRAM RECORD MEDIUM FOR R...

ABSORBANCE METER AND SEMICONDUCTOR MANUFACTURING DEVICE USING ABSOR...

GAS CONTROL SYSTEM AND FILM FORMATION APPARATUS PROVIDED WITH GAS C...

GAS CONTROL SYSTEM, DEPOSITION APPARATUS INCLUDING GAS CONTROL SYST...

CP2Mg CONCENTRATION MEASURING DEVICE

MATERIAL GAS CONCENTRATION CONTROL SYSTEM