Yuichi Hamada

Person

Kobe, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample testing method for automated control of sample retesting
- Patent number 11,635,442
- Issue date Apr 25, 2023
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing system with automated control of sample retesting
- Patent number 11,630,115
- Issue date Apr 18, 2023
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and reagent container
- Patent number 10,031,151
- Issue date Jul 24, 2018
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 9,638,709
- Issue date May 2, 2017
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer, sample analyzing method, and sample analyzing system
- Patent number 9,513,282
- Issue date Dec 6, 2016
- Sysmex Corporation
- Takuma Katou
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus and measurement unit
- Patent number 9,417,254
- Issue date Aug 16, 2016
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Analysis device and reagent container
- Patent number 9,377,477
- Issue date Jun 28, 2016
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing apparatus
- Patent number 9,377,383
- Issue date Jun 28, 2016
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Information management apparatus and sample testing apparatus that...
- Patent number 9,285,379
- Issue date Mar 15, 2016
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing apparatus
- Patent number 9,268,914
- Issue date Feb 23, 2016
- Sysmex Corporation
- Yuichi Hamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample analyzer
- Patent number 9,194,866
- Issue date Nov 24, 2015
- Sysmex Corporation
- Nobuhiro Kitagawa
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer, sample transportation method, and computer program product
- Patent number 9,134,331
- Issue date Sep 15, 2015
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and non-transitory storage medium
- Patent number 8,968,656
- Issue date Mar 3, 2015
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing system with automated control of sample retesting
- Patent number 8,956,569
- Issue date Feb 17, 2015
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing apparatus
- Patent number 8,920,724
- Issue date Dec 30, 2014
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and information writing method
- Patent number 8,894,931
- Issue date Nov 25, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample testing system and transporting apparatus
- Patent number 8,883,078
- Issue date Nov 11, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 8,865,072
- Issue date Oct 21, 2014
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample analyzer and method of notifying user by the same
- Patent number 8,852,506
- Issue date Oct 7, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing system, base for sample processing system, and sa...
- Patent number 8,741,219
- Issue date Jun 3, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and transportation device
- Patent number 8,701,508
- Issue date Apr 22, 2014
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample measuring apparatus and sample measuring method
- Patent number 8,652,848
- Issue date Feb 18, 2014
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Sample processing system, sample processing method, and computer pr...
- Patent number 8,594,836
- Issue date Nov 26, 2013
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and transportation device
- Patent number 8,356,525
- Issue date Jan 22, 2013
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Specimen processing device and specimen processing method
- Patent number 8,347,743
- Issue date Jan 8, 2013
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer and method for aspirating specimen
- Patent number 8,343,770
- Issue date Jan 1, 2013
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer
- Patent number 8,262,994
- Issue date Sep 11, 2012
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Sample measuring apparatus and sample measuring method
- Patent number 8,147,754
- Issue date Apr 3, 2012
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Grant
Analyzer
- Patent number 8,097,211
- Issue date Jan 17, 2012
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Grant
Blood analyzer and blood analyzing method for classifying white blo...
- Patent number 7,916,280
- Issue date Mar 29, 2011
- Sysmex Corporation
- Kunio Ueno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20230243858
- Publication date Aug 3, 2023
- SYSMEX CORPORATION
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20220170952
- Publication date Jun 2, 2022
- SYSMEX CORPORATION
- Yuichi Hamada
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20210325413
- Publication date Oct 21, 2021
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND REAGENT CONTAINER
- Publication number 20160266161
- Publication date Sep 15, 2016
- SYSMEX CORPORATION
- Takaaki NAGAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING
- Publication number 20150118757
- Publication date Apr 30, 2015
- Sysmex Corporation
- Yuichi HAMADA
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PROCESSING APPARATUS
- Publication number 20150064740
- Publication date Mar 5, 2015
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20150004640
- Publication date Jan 1, 2015
- SYSMEX CORPORATION
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER
- Publication number 20140050622
- Publication date Feb 20, 2014
- Sysmex Corporation
- Nobuhiro KITAGAWA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND SAMPLE ANALYZING SYSTEM
- Publication number 20130262143
- Publication date Oct 3, 2013
- SYSMEX CORPORATION
- Takuma KATOU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS AND REAGENT INFORMATION INFORMING METHOD
- Publication number 20130244274
- Publication date Sep 19, 2013
- SYSMEX CORPORATION
- Ken NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER AND TRANSPORTATION DEVICE
- Publication number 20130112014
- Publication date May 9, 2013
- SYSMEX CORPORATION
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING APPARATUS
- Publication number 20130084213
- Publication date Apr 4, 2013
- SYSMEX CORPORATION
- Ken NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND REAGENT CONTAINER
- Publication number 20120321513
- Publication date Dec 20, 2012
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20120244573
- Publication date Sep 27, 2012
- SYSMEX CORPORATION
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
- Publication number 20120164684
- Publication date Jun 28, 2012
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
ANALYZER
- Publication number 20120088293
- Publication date Apr 12, 2012
- Sysmex Corporation
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND INFORMATION WRITING METHOD
- Publication number 20110244558
- Publication date Oct 6, 2011
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYZER AND NON-TRANSITORY STORAGE MEDIUM
- Publication number 20110244557
- Publication date Oct 6, 2011
- Yuichi Hamada
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SAMPLE ANALYZER AND METHOD OF NOTIFYING USER BY THE SAME
- Publication number 20110244580
- Publication date Oct 6, 2011
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING APPARATUS AND METHOD OF CONTROLLING SAMPLE TESTING A...
- Publication number 20110077752
- Publication date Mar 31, 2011
- SYSMEX CORPORATION
- Yuichi Hamada
- G05 - CONTROLLING REGULATING
Information Patent Application
SAMPLE TESTING APPARATUS, INFORMATION MANAGEMENT APPARATUS AND SAMP...
- Publication number 20110039349
- Publication date Feb 17, 2011
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS APPARATUS AND ANALYSIS METHOD
- Publication number 20100330609
- Publication date Dec 30, 2010
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING APPARATUS
- Publication number 20100332191
- Publication date Dec 30, 2010
- Yuichi Hamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS APPARATUS AND MEASUREMENT UNIT
- Publication number 20100332144
- Publication date Dec 30, 2010
- Takaaki Nagai
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PROCESSING DEVICE AND SPECIMEN PROCESSING METHOD
- Publication number 20100282003
- Publication date Nov 11, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING SYSTEM AND TRANSPORTING APPARATUS
- Publication number 20100166605
- Publication date Jul 1, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TESTING SYSTEM, SAMPLE TESTING METHOD, AND COMPUTER PROGRAM...
- Publication number 20100159603
- Publication date Jun 24, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING SYSTEM, SAMPLE PROCESSING METHOD, AND COMPUTER PR...
- Publication number 20100152890
- Publication date Jun 17, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE PROCESSING SYSTEM, BASE FOR SAMPLE PROCESSING SYSTEM, AND SA...
- Publication number 20100150780
- Publication date Jun 17, 2010
- Yuichi Hamada
- G01 - MEASURING TESTING
Information Patent Application
Specimen processing apparatus
- Publication number 20100111384
- Publication date May 6, 2010
- Sysmex Corporation
- Takaaki Nagai
- G01 - MEASURING TESTING

Yuichi Hamada

Person

Patents Grantslast 30 patents

Sample testing method for automated control of sample retesting

Sample testing system with automated control of sample retesting

Analysis device and reagent container

Analysis apparatus and analysis method

Sample analyzer, sample analyzing method, and sample analyzing system

Analysis apparatus and measurement unit

Analysis device and reagent container

Specimen processing apparatus

Information management apparatus and sample testing apparatus that...

Sample testing apparatus

Sample analyzer

Analyzer, sample transportation method, and computer program product

Sample analyzer and non-transitory storage medium

Sample testing system with automated control of sample retesting

Specimen processing apparatus

Sample analyzer and information writing method

Sample testing system and transporting apparatus

Analysis apparatus and analysis method

Sample analyzer and method of notifying user by the same

Sample processing system, base for sample processing system, and sa...

Analyzer and transportation device

Sample measuring apparatus and sample measuring method

Sample processing system, sample processing method, and computer pr...

Analyzer and transportation device

Specimen processing device and specimen processing method

Analyzer and method for aspirating specimen

Analyzer

Sample measuring apparatus and sample measuring method

Analyzer

Blood analyzer and blood analyzing method for classifying white blo...

Patents Applicationslast 30 patents

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

ANALYSIS DEVICE AND REAGENT CONTAINER

SAMPLE TESTING SYSTEM WITH AUTOMATED CONTROL OF SAMPLE RETESTING

SPECIMEN PROCESSING APPARATUS

ANALYSIS APPARATUS AND ANALYSIS METHOD

SAMPLE ANALYZER

SAMPLE ANALYZER, SAMPLE ANALYZING METHOD, AND SAMPLE ANALYZING SYSTEM

SAMPLE PROCESSING APPARATUS AND REAGENT INFORMATION INFORMING METHOD

ANALYZER AND TRANSPORTATION DEVICE

SAMPLE PROCESSING APPARATUS

ANALYSIS DEVICE AND REAGENT CONTAINER

SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD

SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD

ANALYZER

SAMPLE ANALYZER AND INFORMATION WRITING METHOD

SAMPLE ANALYZER AND NON-TRANSITORY STORAGE MEDIUM

SAMPLE ANALYZER AND METHOD OF NOTIFYING USER BY THE SAME

SAMPLE TESTING APPARATUS AND METHOD OF CONTROLLING SAMPLE TESTING A...

SAMPLE TESTING APPARATUS, INFORMATION MANAGEMENT APPARATUS AND SAMP...

ANALYSIS APPARATUS AND ANALYSIS METHOD

SAMPLE TESTING APPARATUS

ANALYSIS APPARATUS AND MEASUREMENT UNIT

SPECIMEN PROCESSING DEVICE AND SPECIMEN PROCESSING METHOD

SAMPLE TESTING SYSTEM AND TRANSPORTING APPARATUS

SAMPLE TESTING SYSTEM, SAMPLE TESTING METHOD, AND COMPUTER PROGRAM...

SAMPLE PROCESSING SYSTEM, SAMPLE PROCESSING METHOD, AND COMPUTER PR...

SAMPLE PROCESSING SYSTEM, BASE FOR SAMPLE PROCESSING SYSTEM, AND SA...

Specimen processing apparatus