Yuichi Ichikawa

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Kawasaki-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Multi-position tolerant contact gauge
- Patent number 11,892,362
- Issue date Feb 6, 2024
- Mitutoyo Corporation
- Yuichi Ichikawa
- G01 - MEASURING TESTING
Information Patent Grant
Photoelectric encoder and photoelectric encoder system
- Patent number 8,546,746
- Issue date Oct 1, 2013
- Mitutoyo Corporation
- Hiroatsu Mori
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 7,043,852
- Issue date May 16, 2006
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Digital displacement measuring instrument
- Patent number 7,020,979
- Issue date Apr 4, 2006
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device using multi-start threaded spindle
- Patent number 7,013,576
- Issue date Mar 21, 2006
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Grant
Analog quantity display method, analog quantity measuring method, a...
- Patent number 6,412,187
- Issue date Jul 2, 2002
- Mitutoyo Corporation
- Koji Sasaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING DEVICE
- Publication number 20220042863
- Publication date Feb 10, 2022
- Mitutoyo Corporation
- Yuichi ICHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASUREMENT APPARATUS
- Publication number 20190353505
- Publication date Nov 21, 2019
- Mitutoyo Corporation
- Masashi Tsuboi
- G01 - MEASURING TESTING
Information Patent Application
PHOTOELECTRIC ENCODER AND PHOTOELECTRIC ENCODER SYSTEM
- Publication number 20120097843
- Publication date Apr 26, 2012
- Mitutoyo Corporation
- Hiroatsu Mori
- G01 - MEASURING TESTING
Information Patent Application
Measuring instrument
- Publication number 20050274034
- Publication date Dec 15, 2005
- Mitutoyo Corporation
- Suuji Hayashida
- G01 - MEASURING TESTING
Information Patent Application
Digital displacement measuring instrument
- Publication number 20040250439
- Publication date Dec 16, 2004
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING
Information Patent Application
Measuring device
- Publication number 20030121169
- Publication date Jul 3, 2003
- Mitutoyo Corporation
- Shuuji Hayashida
- G01 - MEASURING TESTING