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Yuichi Ito
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Ome, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor integrated circuit device for scan testing
Patent number
8,086,889
Issue date
Dec 27, 2011
Hitachi, Ltd.
Yuichi Ito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20090113230
Publication date
Apr 30, 2009
Hitachi, Ltd.
Yuichi Ito
G01 - MEASURING TESTING