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Yuichi Kuroda

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  • Yokohama-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PARTICLE MEASURING APPARATUS
    • Publication number 20170227443
    • Publication date Aug 10, 2017
    • Kabushiki Kaisha Toshiba
    • Masaki HIRANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARTICLE DETECTING APPARATUS
    • Publication number 20170074792
    • Publication date Mar 16, 2017
    • Kabushiki Kaisha Toshiba
    • Masaki Hirano
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARTICLE MEASURING APPARATUS AND PARTICLE MEASURING METHOD
    • Publication number 20170074774
    • Publication date Mar 16, 2017
    • Kabushiki Kaisha Toshiba
    • Yuichi KURODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Particle Supply Device and Particle Supply Method
    • Publication number 20160074821
    • Publication date Mar 17, 2016
    • Kabushiki Kaisha Toshiba
    • Masaki HIRANO
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    WAFER CONTAINER
    • Publication number 20050098218
    • Publication date May 12, 2005
    • Kabushiki Kaisha Toshiba
    • Kiyotaka Inoue
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Wafer container
    • Publication number 20040055650
    • Publication date Mar 25, 2004
    • Kabushiki Kaisha Toshiba
    • Kiyotaka Inoue
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Pod and method of cleaning it
    • Publication number 20010020480
    • Publication date Sep 13, 2001
    • KABUSHIKI KAISHA TOSHIBA
    • Noriaki Yoshikawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Carrier system for carrying objects, carrier unit constituting carr...
    • Publication number 20010008983
    • Publication date Jul 19, 2001
    • Tadashi Yotsumoto
    • H01 - BASIC ELECTRIC ELEMENTS