Yuichi Madokoro

Person

Kokubunji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen preparation device, and control method in specimen prepara...
- Patent number 8,710,464
- Issue date Apr 29, 2014
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device and method for correcting position wit...
- Patent number 8,629,394
- Issue date Jan 14, 2014
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,569,719
- Issue date Oct 29, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam device and focused ion beam processing method
- Patent number 8,552,397
- Issue date Oct 8, 2013
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,405,053
- Issue date Mar 26, 2013
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,999,240
- Issue date Aug 16, 2011
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Liquid metal ion gun
- Patent number 7,804,073
- Issue date Sep 28, 2010
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,791,050
- Issue date Sep 7, 2010
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus for specimen fabrication
- Patent number 7,525,108
- Issue date Apr 28, 2009
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus and liquid metal ion source
- Patent number 7,435,972
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion gun
- Patent number 7,420,181
- Issue date Sep 2, 2008
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,397,051
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,397,050
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,397,052
- Issue date Jul 8, 2008
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus
- Patent number 7,235,798
- Issue date Jun 26, 2007
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion gun
- Patent number 7,211,805
- Issue date May 1, 2007
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus and aperture
- Patent number 7,189,982
- Issue date Mar 13, 2007
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,176,458
- Issue date Feb 13, 2007
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,138,628
- Issue date Nov 21, 2006
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam apparatus and sample processing method
- Patent number 7,084,399
- Issue date Aug 1, 2006
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,071,475
- Issue date Jul 4, 2006
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Liquid metal ion gun
- Patent number 7,005,651
- Issue date Feb 28, 2006
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 6,828,566
- Issue date Dec 7, 2004
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam apparatus and sample processing method
- Patent number 6,822,245
- Issue date Nov 23, 2004
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for sample fabrication
- Patent number 6,538,254
- Issue date Mar 25, 2003
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic head having track width specified by grooves formed with p...
- Patent number 5,910,871
- Issue date Jun 8, 1999
- Hitachi, Ltd.
- Yoshimi Kawanami
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Focused Ion Beam Device and Focused Ion Beam Processing Method
- Publication number 20120235055
- Publication date Sep 20, 2012
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20120085924
- Publication date Apr 12, 2012
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARA...
- Publication number 20110309245
- Publication date Dec 22, 2011
- Yuichi Madokoro
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING POSITION WIT...
- Publication number 20110297826
- Publication date Dec 8, 2011
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20110140006
- Publication date Jun 16, 2011
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20090008578
- Publication date Jan 8, 2009
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20080296516
- Publication date Dec 4, 2008
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECIMEN FABRICATION
- Publication number 20080296497
- Publication date Dec 4, 2008
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Liquid metal ion gun
- Publication number 20080210883
- Publication date Sep 4, 2008
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid metal ion gun
- Publication number 20070257200
- Publication date Nov 8, 2007
- Hitachi High-Technologies Corporation
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ion beam apparatus and aperture
- Publication number 20070152174
- Publication date Jul 5, 2007
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145300
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145302
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145299
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20070145301
- Publication date Jun 28, 2007
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20060231776
- Publication date Oct 19, 2006
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20060192099
- Publication date Aug 31, 2006
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Liquid metal ion gun
- Publication number 20060097186
- Publication date May 11, 2006
- Hitachi High-Technologies
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ion beam apparatus and aperture
- Publication number 20060054840
- Publication date Mar 16, 2006
- Hitachi High-Technologies Corporation
- Yuichi Madokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Focused ion beam apparatus
- Publication number 20050279952
- Publication date Dec 22, 2005
- Hitachi High-Technologies Corporation
- Tohru Ishitani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid metal ion gun
- Publication number 20050127304
- Publication date Jun 16, 2005
- Hiroyasu Kaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion beam apparatus and sample processing method
- Publication number 20050092922
- Publication date May 5, 2005
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20050054029
- Publication date Mar 10, 2005
- Hitachi, Ltd.
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20030183776
- Publication date Oct 2, 2003
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Application
Ion beam apparatus and sample processing method
- Publication number 20020008208
- Publication date Jan 24, 2002
- Hitachi, Ltd.
- Hiroyuki Muto
- H01 - BASIC ELECTRIC ELEMENTS

Yuichi Madokoro

Person

Patents Grantslast 30 patents

Specimen preparation device, and control method in specimen prepara...

Charged particle beam device and method for correcting position wit...

Method and apparatus for specimen fabrication

Focused ion beam device and focused ion beam processing method

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Liquid metal ion gun

Method and apparatus for specimen fabrication

Focused ion beam apparatus for specimen fabrication

Focused ion beam apparatus and liquid metal ion source

Liquid metal ion gun

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Focused ion beam apparatus

Liquid metal ion gun

Focused ion beam apparatus and aperture

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Ion beam apparatus and sample processing method

Method and apparatus for specimen fabrication

Liquid metal ion gun

Method and apparatus for specimen fabrication

Ion beam apparatus and sample processing method

Method and apparatus for sample fabrication

Magnetic head having track width specified by grooves formed with p...

Patents Applicationslast 30 patents

Focused Ion Beam Device and Focused Ion Beam Processing Method

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARA...

CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING POSITION WIT...

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

METHOD AND APPARATUS FOR SPECIMEN FABRICATION

Liquid metal ion gun

Liquid metal ion gun

Focused ion beam apparatus and aperture

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Liquid metal ion gun

Focused ion beam apparatus and aperture

Focused ion beam apparatus

Liquid metal ion gun

Ion beam apparatus and sample processing method

Method and apparatus for specimen fabrication

Method and apparatus for specimen fabrication

Ion beam apparatus and sample processing method