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YUICHI MIYAJI

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Patents Grantslast 30 patents

  • Information Patent Grant

    Measurement apparatus and measurement method
    • Patent number 7,808,252
    • Issue date Oct 5, 2010
    • Advantest Corporation
    • Atsuo Sawara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Oscillating apparatus
    • Patent number 7,612,590
    • Issue date Nov 3, 2009
    • Advantest Corporation
    • Hiroki Kimura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Oscillating apparatus
    • Patent number 7,605,621
    • Issue date Oct 20, 2009
    • Advantest Corporation
    • Hiroki Kimura
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Jitter applying circuit and test apparatus
    • Patent number 7,287,200
    • Issue date Oct 23, 2007
    • Advantest Corporation
    • Yuichi Miyaji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Jitter measuring device and method
    • Patent number 6,522,122
    • Issue date Feb 18, 2003
    • Advantest Corporation
    • Toshifumi Watanabe
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents