Yuichi NAKATANI

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and method with local critical dimensi...
- Patent number 7,756,318
- Issue date Jul 13, 2010
- Advanced Mask Inspection Technology Inc.
- Yuichi Nakatani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Workpiece inspection apparatus, workpiece inspection method and com...
- Patent number 7,643,668
- Issue date Jan 5, 2010
- Advanced Mask Inspection Technology Inc.
- Yuichi Nakatani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and apparatus using linear predictive mod...
- Patent number 7,627,165
- Issue date Dec 1, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image correction method
- Patent number 7,539,350
- Issue date May 26, 2009
- Advanced Mask Inspection Technology Inc.
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD WITH LOCAL CRITICAL DIMENSI...
- Publication number 20070292014
- Publication date Dec 20, 2007
- Advanced Mask Inspection Technology Inc.
- Yuichi NAKATANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Workpiece inspection apparatus, workpiece inspection method and com...
- Publication number 20070071308
- Publication date Mar 29, 2007
- Advanced Mask Inspection Technology
- Yuichi Nakatani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection method and apparatus using linear predictive mod...
- Publication number 20070064996
- Publication date Mar 22, 2007
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image correction method
- Publication number 20060215900
- Publication date Sep 28, 2006
- Junji Oaki
- G06 - COMPUTING CALCULATING COUNTING