Yuichi Nansai

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Device testing apparatus and test method
- Patent number 6,313,654
- Issue date Nov 6, 2001
- Advantest Corporation
- Yuichi Nansai
- G01 - MEASURING TESTING
Information Patent Grant
IC testing apparatus
- Patent number 6,257,319
- Issue date Jul 10, 2001
- Advantest Corporation
- Tadashi Kainuma
- G01 - MEASURING TESTING