Yuichi Ogawa

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Wako-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for detecting scattered material by terahertz...
- Patent number 7,291,838
- Issue date Nov 6, 2007
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for detecting scattered material by Terahertz...
- Publication number 20060043298
- Publication date Mar 2, 2006
- Riken
- Kodo Kawase
- G01 - MEASURING TESTING