Yuichi Ogawa

Person

Sendai-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Bioparticle observation apparatus and bioparticle observation method
- Patent number 10,816,536
- Issue date Oct 27, 2020
- SHARP KABUSHIKI KAISHA
- Takeshi Mitsunaka
- G01 - MEASURING TESTING
Information Patent Grant
Elapsed-time determination apparatus, deciding apparatus, deciding...
- Patent number 9,679,189
- Issue date Jun 13, 2017
- Panasonic Corporation
- Yumiko Kato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solution testing equipment
- Patent number 9,431,960
- Issue date Aug 30, 2016
- Rohm Co., Ltd.
- Toshikazu Mukai
- G01 - MEASURING TESTING
Information Patent Grant
Specimen measuring method
- Patent number 9,366,620
- Issue date Jun 14, 2016
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Aperture array structure and measurement method using the same
- Patent number 9,341,561
- Issue date May 17, 2016
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Reflective imaging device and image acquisition method
- Patent number 9,071,776
- Issue date Jun 30, 2015
- NEC Corporation
- Naoki Oda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for measurement of properties of analyte
- Patent number 9,007,578
- Issue date Apr 14, 2015
- MURATA MANUFACTURING CO., LTD.
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample analysis method
- Patent number 8,514,403
- Issue date Aug 20, 2013
- TOHOKU UNIVERSITY
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 8,492,718
- Issue date Jul 23, 2013
- Advantest Corporation
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring characteristic of object to be measured, struc...
- Patent number 8,269,967
- Issue date Sep 18, 2012
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave measuring apparatus having space arrangement structu...
- Patent number 8,253,103
- Issue date Aug 28, 2012
- Advantest Corporation
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Pellet for use in spectrometry, method of preparing the same, and m...
- Patent number 8,030,618
- Issue date Oct 4, 2011
- ARKRAY, Inc.
- Masashi Okamoto
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
Bacteria Detection Device and Bacteria Detection Method
- Publication number 20240344107
- Publication date Oct 17, 2024
- Shimadzu Corporation
- Hiroshi IWATA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
MICROORGANISM TEST METHOD AND MICROORGANISM TEST APPARATUS
- Publication number 20230212638
- Publication date Jul 6, 2023
- KYOTO UNIVERSITY
- Shojiro KIKUCHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
BIOPARTICLE OBSERVATION APPARATUS AND BIOPARTICLE OBSERVATION METHOD
- Publication number 20190376947
- Publication date Dec 12, 2019
- Sharp Kabushiki Kaisha
- TAKESHI MITSUNAKA
- G01 - MEASURING TESTING
Information Patent Application
ELAPSED-TIME DETERMINATION APPARATUS, DECIDING APPARATUS, DECIDING...
- Publication number 20160092723
- Publication date Mar 31, 2016
- PANASONIC CORPORATION
- YUMIKO KATO
- G01 - MEASURING TESTING
Information Patent Application
APERTURE ARRAY STRUCTURE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20150136989
- Publication date May 21, 2015
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G02 - OPTICS
Information Patent Application
SOLUTION TESTING EQUIPMENT
- Publication number 20140139238
- Publication date May 22, 2014
- KYOTO UNIVERSITY
- Toshikazu MUKAI
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN MEASURING METHOD
- Publication number 20140084164
- Publication date Mar 27, 2014
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVE IMAGING DEVICE AND IMAGE ACQUISITION METHOD
- Publication number 20130076912
- Publication date Mar 28, 2013
- National Institute of Information and Communications Technology
- Naoki Oda
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND APERTURE ARRAY...
- Publication number 20130062524
- Publication date Mar 14, 2013
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20120235043
- Publication date Sep 20, 2012
- Advantest Corporation
- Yuichi OGAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE
- Publication number 20120137755
- Publication date Jun 7, 2012
- National University Corporation, Tohoku University
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING CHARACTERISTIC OF OBJECT TO BE MEASURED, STRUC...
- Publication number 20120008142
- Publication date Jan 12, 2012
- NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS METHOD
- Publication number 20110205528
- Publication date Aug 25, 2011
- Tohoku University
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Application
PELLET FOR USE IN SPECTROMETRY, METHOD OF PREPARING THE SAME, AND M...
- Publication number 20100243901
- Publication date Sep 30, 2010
- ARKRAY Inc.
- Masashi Okamoto
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
PELLET FOR SPECTROMETRY, PROCESS FOR PRODUCING THE PELLET, AND METH...
- Publication number 20100108887
- Publication date May 6, 2010
- Arkray Inc.
- Yuichi Ogawa
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20100025586
- Publication date Feb 4, 2010
- Advantest Corporation
- Yuichi OGAWA
- G01 - MEASURING TESTING

Yuichi Ogawa

Person

Patents Grantslast 30 patents

Bioparticle observation apparatus and bioparticle observation method

Elapsed-time determination apparatus, deciding apparatus, deciding...

Solution testing equipment

Specimen measuring method

Aperture array structure and measurement method using the same

Reflective imaging device and image acquisition method

Method for measurement of properties of analyte

Sample analysis method

Measurement apparatus and measurement method

Method for measuring characteristic of object to be measured, struc...

Terahertz wave measuring apparatus having space arrangement structu...

Pellet for use in spectrometry, method of preparing the same, and m...

Patents Applicationslast 30 patents

Bacteria Detection Device and Bacteria Detection Method

MICROORGANISM TEST METHOD AND MICROORGANISM TEST APPARATUS

BIOPARTICLE OBSERVATION APPARATUS AND BIOPARTICLE OBSERVATION METHOD

ELAPSED-TIME DETERMINATION APPARATUS, DECIDING APPARATUS, DECIDING...

APERTURE ARRAY STRUCTURE AND MEASUREMENT METHOD USING THE SAME

SOLUTION TESTING EQUIPMENT

SPECIMEN MEASURING METHOD

REFLECTIVE IMAGING DEVICE AND IMAGE ACQUISITION METHOD

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND APERTURE ARRAY...

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE

METHOD FOR MEASURING CHARACTERISTIC OF OBJECT TO BE MEASURED, STRUC...

SAMPLE ANALYSIS METHOD

PELLET FOR USE IN SPECTROMETRY, METHOD OF PREPARING THE SAME, AND M...

PELLET FOR SPECTROMETRY, PROCESS FOR PRODUCING THE PELLET, AND METH...

MEASUREMENT APPARATUS AND MEASUREMENT METHOD