Yuichi Sakurai

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Work support device, work support method, and work support program
- Patent number 11,392,871
- Issue date Jul 19, 2022
- Hitachi, Ltd.
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Facility state determination device, facility state determination m...
- Patent number 10,908,595
- Issue date Feb 2, 2021
- Hitachi, Ltd.
- Yuichi Sakurai
- G05 - CONTROLLING REGULATING
Information Patent Grant
State identification device, state identification method and mechan...
- Patent number 10,845,794
- Issue date Nov 24, 2020
- Hitachi, Ltd.
- Hideo Sakai
- E02 - HYDRAULIC ENGINEERING FOUNDATIONS SOIL SHIFTING
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,763,078
- Issue date Sep 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and image processing method in charged...
- Patent number 10,522,325
- Issue date Dec 31, 2019
- Hitachi High-Technologies Corporation
- Masato Kamio
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing device, semiconductor external view inspection devi...
- Patent number 9,489,324
- Issue date Nov 8, 2016
- Hitachi High-Technologies Corporation
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting defects of semiconductor device
- Patent number 8,385,627
- Issue date Feb 26, 2013
- Hitachi High-Technologies Corporation
- Tadanobu Toba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspecting apparatus
- Patent number 8,032,332
- Issue date Oct 4, 2011
- Hitachi High-Technologies Corporation
- Yuichi Sakurai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FACILITY DIAGNOSIS DEVICE AND FACILITY DIAGNOSIS METHOD
- Publication number 20220404821
- Publication date Dec 22, 2022
- Hitachi, Ltd
- Shuichi NISHINO
- G05 - CONTROLLING REGULATING
Information Patent Application
WORK SUPPORT DEVICE, WORK SUPPORT METHOD, AND WORK SUPPORT PROGRAM
- Publication number 20200401972
- Publication date Dec 24, 2020
- Hitachi, Ltd
- Yuichi SAKURAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20200066484
- Publication date Feb 27, 2020
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FACILITY STATE DETERMINATION DEVICE, FACILITY STATE DETERMINATION M...
- Publication number 20190384268
- Publication date Dec 19, 2019
- Hitachi, Ltd.
- Yuichi SAKURAI
- G05 - CONTROLLING REGULATING
Information Patent Application
STATE IDENTIFICATION DEVICE, STATE IDENTIFICATION METHOD AND MECHAN...
- Publication number 20190324428
- Publication date Oct 24, 2019
- Hitachi, Ltd
- Hideo SAKAI
- G05 - CONTROLLING REGULATING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...
- Publication number 20180301316
- Publication date Oct 18, 2018
- Hitachi High-Technologies Corporation
- Masato KAMIO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA PROCESSING DEVICE, SEMICONDUCTOR EXTERNAL VIEW INSPECTION DEVI...
- Publication number 20140372656
- Publication date Dec 18, 2014
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Inspecting Apparatus
- Publication number 20130136334
- Publication date May 30, 2013
- Hitachi High-Technologies Corporation
- Yuichi Sakurai
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTING APPARATUS
- Publication number 20080262760
- Publication date Oct 23, 2008
- Yuichi Sakurai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for inspecting defects of semiconductor device
- Publication number 20070036421
- Publication date Feb 15, 2007
- Tadanobu Toba
- G06 - COMPUTING CALCULATING COUNTING

Yuichi Sakurai

Person

Patents Grantslast 30 patents

Work support device, work support method, and work support program

Facility state determination device, facility state determination m...

State identification device, state identification method and mechan...

Charged particle beam device and image processing method in charged...

Charged particle beam device and image processing method in charged...

Data processing device, semiconductor external view inspection devi...

Method and apparatus for inspecting defects of semiconductor device

Semiconductor inspecting apparatus

Patents Applicationslast 30 patents

FACILITY DIAGNOSIS DEVICE AND FACILITY DIAGNOSIS METHOD

WORK SUPPORT DEVICE, WORK SUPPORT METHOD, AND WORK SUPPORT PROGRAM

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

FACILITY STATE DETERMINATION DEVICE, FACILITY STATE DETERMINATION M...

STATE IDENTIFICATION DEVICE, STATE IDENTIFICATION METHOD AND MECHAN...

CHARGED PARTICLE BEAM DEVICE AND IMAGE PROCESSING METHOD IN CHARGED...

DATA PROCESSING DEVICE, SEMICONDUCTOR EXTERNAL VIEW INSPECTION DEVI...

Semiconductor Inspecting Apparatus

SEMICONDUCTOR INSPECTING APPARATUS

Method and apparatus for inspecting defects of semiconductor device