Yuichi Takano

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Osaka-city, JP

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Patents Grantslast 30 patents

Information Patent Grant
Conductive probe for scanning microscope and machining method using...
- Patent number 6,787,769
- Issue date Sep 7, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning microscope produced by focused ion beam machining
- Patent number 6,759,653
- Issue date Jul 6, 2004
- Yoshikazu Nakayama
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for vertical scanning microscope and probe for vertical...
- Patent number 6,705,154
- Issue date Mar 16, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Cantilever for vertical scanning microscope and probe for vertical...
- Publication number 20030010100
- Publication date Jan 16, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY
Information Patent Application
Conductive probe for scanning microscope and machining method using...
- Publication number 20030001091
- Publication date Jan 2, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY