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Yuichi Tsubaki

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  • Kanagawa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    IC device testing socket
    • Patent number 8,957,693
    • Issue date Feb 17, 2015
    • 3M Innovative Properties Company
    • Yuichi Tsubaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact holder
    • Patent number 8,911,266
    • Issue date Dec 16, 2014
    • 3M Innovative Properties Company
    • Yoshihisa Kawate
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electronic device socket
    • Patent number 8,556,638
    • Issue date Oct 15, 2013
    • 3M Innovative Properties Company
    • Yuichi Tsubaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Contact Holder
    • Publication number 20130065455
    • Publication date Mar 14, 2013
    • 3M Innovative Properties Company
    • Yoshihisa Kawata
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC DEVICE TESTING SOCKET
    • Publication number 20120182037
    • Publication date Jul 19, 2012
    • Yuichi Tsubaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC DEVICE SOCKET
    • Publication number 20110171841
    • Publication date Jul 14, 2011
    • Yuichi Tsubaki
    • G01 - MEASURING TESTING