Yuichi Watanabe

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor testing circuit, semiconductor testing jig, semicondu...
- Patent number 8,736,295
- Issue date May 27, 2014
- Fujitsu Limited
- Yuichi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Indexing device installation unit
- Patent number 8,731,128
- Issue date May 20, 2014
- Toshiba Plant Systems & Services Corporation
- Ryujiro Sugano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
INDEXING DEVICE INSTALLATION UNIT
- Publication number 20110096889
- Publication date Apr 28, 2011
- Ryujiro Sugano
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SEMICONDUCTOR TESTING CIRCUIT, SEMICONDUCTOR TESTING JIG, SEMICONDU...
- Publication number 20110057681
- Publication date Mar 10, 2011
- Fujitsu Limited
- Yuichi Watanabe
- G01 - MEASURING TESTING