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Yuichiro HARADA
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Gunma, JP
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Patents Grants
last 30 patents
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Patent Grant
Test apparatus and test method
Patent number
11,137,446
Issue date
Oct 5, 2021
Advantest Corporation
Shuichi Inage
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Signal display device, method, and recording medium
Patent number
9,417,265
Issue date
Aug 16, 2016
Advantest Corporation
Yuichiro Harada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20200225286
Publication date
Jul 16, 2020
Advantest Corporation
Shuichi INAGE
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL DISPLAY DEVICE, METHOD, AND RECORDING MEDIUM
Publication number
20120319855
Publication date
Dec 20, 2012
Advantest Corporation
Yuichiro HARADA
G01 - MEASURING TESTING