Yuichiro Iijima

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection apparatus, substrate mounting device and inspection method
- Patent number 8,723,536
- Issue date May 13, 2014
- Hitachi High-Technologies Corporation
- Yusuke Miyazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SUBSTRATE HOLDING DEVICE AND METHOD, AND INSPECTION APPARATUS AND M...
- Publication number 20130154675
- Publication date Jun 20, 2013
- Hitachi High-Technologies Corporation
- Yusuke Miyazaki
- G01 - MEASURING TESTING