Yuichiro Ohori

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope
- Patent number 10,361,062
- Issue date Jul 23, 2019
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 10,269,531
- Issue date Apr 23, 2019
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Focused Ion Beam System and Method of Correcting Deviation of Field...
- Publication number 20230230801
- Publication date Jul 20, 2023
- JEOL Ltd.
- Yuichiro Ohori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20180261422
- Publication date Sep 13, 2018
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20180240644
- Publication date Aug 23, 2018
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS