Yuichiro SANUKI

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Urayasu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and semiconductor device examination method
- Patent number 11,740,287
- Issue date Aug 29, 2023
- Kioxia Corporation
- Isao Ooigawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor circuit
- Patent number 10,311,965
- Issue date Jun 4, 2019
- TOSHIBA MEMORY CORPORATION
- Tsutomu Miyamae
- G01 - MEASURING TESTING
Information Patent Grant
Memory system capable of wireless communication and method of contr...
- Patent number 10,095,638
- Issue date Oct 9, 2018
- TOSHIBA MEMORY CORPORATION
- Yuichiro Sanuki
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUTOR DEVCE EXAMINATION METHOD
- Publication number 20230079823
- Publication date Mar 16, 2023
- KIOXIA Corporation
- Isao OOIGAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR CIRCUIT
- Publication number 20180233213
- Publication date Aug 16, 2018
- Toshiba Memory Corporation
- Tsutomu MIYAMAE
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM CAPABLE OF WIRELESS COMMUNICATION AND METHOD OF CONTR...
- Publication number 20160062922
- Publication date Mar 3, 2016
- KABUSHIKI KAISHA TOSHIBA
- Yuichiro SANUKI
- G06 - COMPUTING CALCULATING COUNTING