Yuichiro YAMAJI

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic field detection device and magnetic field detection device...
- Patent number 12,117,506
- Issue date Oct 15, 2024
- TDK Corporation
- Takato Fukui
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic sensor
- Patent number 12,105,164
- Issue date Oct 1, 2024
- TDK Corporation
- Yuichiro Yamaji
- G01 - MEASURING TESTING
Information Patent Grant
Correction apparatus and method for angle sensor, and angle sensor
- Patent number 10,254,135
- Issue date Apr 9, 2019
- TDK Corporation
- Shinichirou Mochizuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC SENSOR AND ITS MANUFACTURING METHOD
- Publication number 20230296700
- Publication date Sep 21, 2023
- TDK Corporation
- Yuichiro YAMAJI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR AND ITS MANUFACTURING METHOD
- Publication number 20230288503
- Publication date Sep 14, 2023
- TDK Corporation
- Yuichiro YAMAJI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE AND MAGNETIC FIELD DETECTION DEVICE...
- Publication number 20230204686
- Publication date Jun 29, 2023
- TDK Corporation
- Takato FUKUI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD DETECTION DEVICE AND MAGNETIC FIELD DETECTION DEVICE...
- Publication number 20230176145
- Publication date Jun 8, 2023
- TDK Corporation
- Makoto KAMENO
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20230118663
- Publication date Apr 20, 2023
- TDK Corporation
- Yuichiro YAMAJI
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR
- Publication number 20220299581
- Publication date Sep 22, 2022
- TDK Corpoaration
- Yuichiro Yamaji
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION APPARATUS AND METHOD FOR ANGLE SENSOR, AND ANGLE SENSOR
- Publication number 20170030742
- Publication date Feb 2, 2017
- TDK Corporation
- Shinichirou MOCHIZUKI
- G01 - MEASURING TESTING