Yuichiro YAMAZAKI

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Secondary particle detection system of scanning electron microscope
- Patent number 10,515,778
- Issue date Dec 24, 2019
- NGR Inc.
- Sumio Sasaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20180005797
- Publication date Jan 4, 2018
- NGR Inc.
- Makoto KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY PARTICLE DETECTION SYSTEM OF SCANNING ELECTRON MICROSCOPE
- Publication number 20170271124
- Publication date Sep 21, 2017
- NGR Inc.
- Sumio SASAKI
- H01 - BASIC ELECTRIC ELEMENTS