Yuichiro Yokoyama

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Laser interference device
- Patent number 11,378,386
- Issue date Jul 5, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Laser interference device
- Patent number 11,353,315
- Issue date Jun 7, 2022
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G02 - OPTICS
Information Patent Grant
Measuring device for coefficient of thermal expansion and measureme...
- Patent number 10,969,355
- Issue date Apr 6, 2021
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for coefficient of thermal expansion and measureme...
- Patent number 10,900,917
- Issue date Jan 26, 2021
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Coefficient-of-thermal-expansion measurement method and measuring d...
- Patent number 10,627,204
- Issue date Apr 21, 2020
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Spherical shape measurement method and apparatus for rotating a sph...
- Patent number 10,444,008
- Issue date Oct 15, 2019
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Coefficient-of-thermal-expansion measurement method of dimension re...
- Patent number 10,352,678
- Issue date Jul 16, 2019
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Temperature-controlled bath
- Patent number 9,518,944
- Issue date Dec 13, 2016
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Spherical shape measurement method and apparatus
- Patent number 9,347,771
- Issue date May 24, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Spherical-form measuring apparatus
- Patent number 9,297,631
- Issue date Mar 29, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Abscissa calibration jig and abscissa calibration method of laser i...
- Patent number 8,879,068
- Issue date Nov 4, 2014
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Fizeau interferometer and measurement method using Fizeau interfero...
- Patent number 8,379,222
- Issue date Feb 19, 2013
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Spherical-form measuring apparatus
- Patent number 8,356,417
- Issue date Jan 22, 2013
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Grant
Size difference measuring method and size difference measuring appa...
- Patent number 7,486,404
- Issue date Feb 3, 2009
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER INTERFERENCE DEVICE
- Publication number 20210293523
- Publication date Sep 23, 2021
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
LASER INTERFERENCE DEVICE
- Publication number 20210247176
- Publication date Aug 12, 2021
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...
- Publication number 20190064090
- Publication date Feb 28, 2019
- Mitutoyo Corporation
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...
- Publication number 20190064089
- Publication date Feb 28, 2019
- Mitutoyo Corporation
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
COEFFICIENT-OF-THERMAL-EXPANSION MEASUREMENT METHOD AND MEASURING D...
- Publication number 20180180396
- Publication date Jun 28, 2018
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
Coefficient-Of-Thermal-Expansion Measurement Method Of Dimension Re...
- Publication number 20170089683
- Publication date Mar 30, 2017
- Mitutoyo Corporation
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS
- Publication number 20160018216
- Publication date Jan 21, 2016
- Mitutoyo Corporation
- Takeshi HAGINO
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS
- Publication number 20160018215
- Publication date Jan 21, 2016
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-CONTROLLED BATH
- Publication number 20150003494
- Publication date Jan 1, 2015
- MITUTOYO CORPORATION
- Yuichiro YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL-FORM MEASURING APPARATUS
- Publication number 20140130363
- Publication date May 15, 2014
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
ABSCISSA CALIBRATION JIG AND ABSCISSA CALIBRATION METHOD OF LASER I...
- Publication number 20130021614
- Publication date Jan 24, 2013
- MITUTOYO CORPORATION
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
SPHERICAL-FORM MEASURING APPARATUS
- Publication number 20110173830
- Publication date Jul 21, 2011
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
FIZEAU INTERFEROMETER AND MEASUREMENT METHOD USING FIZEAU INTERFERO...
- Publication number 20110134437
- Publication date Jun 9, 2011
- Mitutoyo Corporation
- Takeshi Hagino
- G01 - MEASURING TESTING
Information Patent Application
Size difference measuring method and size difference measuring appa...
- Publication number 20070242278
- Publication date Oct 18, 2007
- Mitutoyo Corporation
- Yuichiro Yokoyama
- G01 - MEASURING TESTING

Yuichiro Yokoyama

Person

Patents Grantslast 30 patents

Laser interference device

Laser interference device

Measuring device for coefficient of thermal expansion and measureme...

Measuring device for coefficient of thermal expansion and measureme...

Coefficient-of-thermal-expansion measurement method and measuring d...

Spherical shape measurement method and apparatus for rotating a sph...

Coefficient-of-thermal-expansion measurement method of dimension re...

Temperature-controlled bath

Spherical shape measurement method and apparatus

Spherical-form measuring apparatus

Abscissa calibration jig and abscissa calibration method of laser i...

Fizeau interferometer and measurement method using Fizeau interfero...

Spherical-form measuring apparatus

Size difference measuring method and size difference measuring appa...

Patents Applicationslast 30 patents

LASER INTERFERENCE DEVICE

LASER INTERFERENCE DEVICE

MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...

MEASURING DEVICE FOR COEFFICIENT OF THERMAL EXPANSION AND MEASUREME...

COEFFICIENT-OF-THERMAL-EXPANSION MEASUREMENT METHOD AND MEASURING D...

Coefficient-Of-Thermal-Expansion Measurement Method Of Dimension Re...

SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS

SPHERICAL SHAPE MEASUREMENT METHOD AND APPARATUS

TEMPERATURE-CONTROLLED BATH

SPHERICAL-FORM MEASURING APPARATUS

ABSCISSA CALIBRATION JIG AND ABSCISSA CALIBRATION METHOD OF LASER I...

SPHERICAL-FORM MEASURING APPARATUS

FIZEAU INTERFEROMETER AND MEASUREMENT METHOD USING FIZEAU INTERFERO...

Size difference measuring method and size difference measuring appa...